Theory and application of electron channelling contrast imaging under controlled diffraction conditions
S Zaefferer, NN Elhami - Acta Materialia, 2014 - Elsevier
Electron channelling contrast imaging (ECCI) is a powerful technique for observing crystal
defects, such as dislocations, stacking faults, twins and grain boundaries in the scanning …
defects, such as dislocations, stacking faults, twins and grain boundaries in the scanning …
Physics-based simulation models for EBSD: advances and challenges
EBSD has evolved into an effective tool for microstructure investigations in the scanning
electron microscope. The purpose of this contribution is to give an overview of various …
electron microscope. The purpose of this contribution is to give an overview of various …
[HTML][HTML] Electron channelling contrast imaging for III-nitride thin film structures
Electron channelling contrast imaging (ECCI) performed in a scanning electron microscope
(SEM) is a rapid and non-destructive structural characterisation technique for imaging …
(SEM) is a rapid and non-destructive structural characterisation technique for imaging …
Scanning Electron Microscopy versus Transmission Electron Microscopy for Material Characterization: A Comparative Study on High‐Strength Steels
N Brodusch, SV Brahimi, E Barbosa De Melo… - …, 2021 - Wiley Online Library
The microstructures of quenched and tempered steels have been traditionally explored by
transmission electron microscopy (TEM) rather than scanning electron microscopy (SEM) …
transmission electron microscopy (TEM) rather than scanning electron microscopy (SEM) …
[PDF][PDF] Study of the Effect of the Image Scanning Speed and the Type of Conductive Coating on the Quality of Sem-Micrographs of Oxide Nano Materials for Medical …
TJH Tovlahanova, MU Suleimanova… - Annals of Medical …, 2021 - researchgate.net
Within the framework of this work, the results of the study of ZnO and SiO2 samples by
scanning electron microscopy at various scanning parameters are presented. It is …
scanning electron microscopy at various scanning parameters are presented. It is …
A 2D and 3D nanostructural study of naturally deformed pyrite: assessing the links between trace element mobility and defect structures
The links between deformation-induced micro-and nanostructures and trace element
mobility in sulphide minerals have recently become a popular subject of research in the …
mobility in sulphide minerals have recently become a popular subject of research in the …
[HTML][HTML] Cross-correlation based high resolution electron backscatter diffraction and electron channelling contrast imaging for strain map** and dislocation …
A Vilalta-Clemente, G Naresh-Kumar, M Nouf-Allehiani… - Acta Materialia, 2017 - Elsevier
We describe the development of cross-correlation based high resolution electron
backscatter diffraction (HR-EBSD) and electron channelling contrast imaging (ECCI), in the …
backscatter diffraction (HR-EBSD) and electron channelling contrast imaging (ECCI), in the …
Accurate electron channeling contrast analysis of dislocations in fine grained bulk materials
Non-destructive, comprehensive dislocations characterization in fine grained Interstitial-Free
Steel was realized for the first time by Accurate Electron Channeling Contrast Imaging “A …
Steel was realized for the first time by Accurate Electron Channeling Contrast Imaging “A …
Sub-micron resolution selected area electron channeling patterns
Collection of selected area channeling patterns (SACPs) on a high resolution FEG-SEM is
essential to carry out quantitative electron channeling contrast imaging (ECCI) studies, as it …
essential to carry out quantitative electron channeling contrast imaging (ECCI) studies, as it …
Comparison of dislocation characterization by electron channeling contrast imaging and cross-correlation electron backscattered diffraction
In this work, the relative capabilities and limitations of electron channeling contrast imaging
(ECCI) and cross-correlation electron backscattered diffraction (CC-EBSD) have been …
(ECCI) and cross-correlation electron backscattered diffraction (CC-EBSD) have been …