Reliable on-chip systems in the nano-era: Lessons learnt and future trends

J Henkel, L Bauer, N Dutt, P Gupta, S Nassif… - Proceedings of the 50th …, 2013‏ - dl.acm.org
Reliability concerns due to technology scaling have been a major focus of researchers and
designers for several technology nodes. Therefore, many new techniques for enhancing and …

Variability mitigation in nanometer CMOS integrated systems: A survey of techniques from circuits to software

A Rahimi, L Benini, RK Gupta - Proceedings of the IEEE, 2016‏ - ieeexplore.ieee.org
Variation in performance and power across manufactured parts and their operating
conditions is an accepted reality in modern microelectronic manufacturing processes with …

Aging-aware logic synthesis

M Ebrahimi, F Oboril, S Kiamehr… - 2013 IEEE/ACM …, 2013‏ - ieeexplore.ieee.org
As CMOS technology scales down into the nanometer regime, designers have to add
pessimistic timing margins to the circuit as guardbands to avoid timing violations due to …

SlackProbe: A Flexible and Efficient In Situ Timing Slack Monitoring Methodology

L Lai, V Chandra, RC Aitken… - IEEE Transactions on …, 2014‏ - ieeexplore.ieee.org
In situ monitoring is an accurate way to monitor circuit delay or timing slack, but usually
incurs significant overhead. We observe that most existing slack monitoring methods focus …

Aging-and variation-aware delay monitoring using representative critical path selection

F Firouzi, F Ye, K Chakrabarty, MB Tahoori - ACM Transactions on …, 2015‏ - dl.acm.org
Process together with runtime variations in temperature and voltage, as well as transistor
aging, degrade path delay and may eventually induce circuit failure due to timing variations …

A wide-voltage-range half-path timing error-detection system with a 9-transistor transition-detector in 40-nm CMOS

W Shan, X Shang, X Wan, H Cai… - IEEE Transactions on …, 2019‏ - ieeexplore.ieee.org
To reduce conservative timing margin in digital circuit designs, adaptive techniques based
on timing-error detection were proposed to monitor the timing of selected critical paths …

Flexibility-aware system-on-polymer (SoP): Concept to prototype

U Gupta, J Park, H Joshi… - IEEE Transactions on Multi …, 2016‏ - ieeexplore.ieee.org
Mechanically flexible, printed, and stretchable electronics are gaining momentum. While
rapid advancement is well underway at the device and circuit levels, researchers have yet to …

Synthesis and analysis of design-dependent ring oscillator (DDRO) performance monitors

TB Chan, P Gupta, AB Kahng… - IEEE transactions on very …, 2013‏ - ieeexplore.ieee.org
With CMOS technology scaling, circuit performance has become more sensitive to
manufacturing and environmental variations. Hence, there is a need to measure or monitor …

Device aging: A reliability and security concern

D Kraak, M Taouil, S Hamdioui, P Weckx… - 2018 IEEE 23rd …, 2018‏ - ieeexplore.ieee.org
Device aging is an important concern in nanoscale designs. Due to aging the electrical
behavior of transistors embedded in an integrated circuit deviates from original intended …

Acet: An adaptive clock scheme exploiting comprehensive timing slack for reconfigurable processors

S Ji, W Yang, J Jiang, N **g, W Sheng… - 2023 IEEE 41st …, 2023‏ - ieeexplore.ieee.org
To ensure the correctness and reliability, digital circuits are designed with conservative
timing margins to accommodate extreme variations in process, voltage, and temperature …