[HTML][HTML] Multiphase-field analysis of the intermetallic compounds formation & evolution in friction stir welding of dissimilar Al/Mg alloys

F Zhao, L Shi, J Gao, CS Wu - Journal of Materials Research and …, 2024 - Elsevier
It is essential to understand the formation and evolution mechanism of intermetallic
compounds (IMCs) in friction stir welding (FSW) of dissimilar Al/Mg alloys to mitigate the …

A data-driven framework to predict the morphology of interfacial Cu6Sn5 IMC in SAC/Cu system during laser soldering

A Kunwar, L An, J Liu, S Shang, P Råback, H Ma… - Journal of Materials …, 2020 - Elsevier
A data-driven approach combining together the experimental laser soldering, finite element
analysis and machine learning, has been utilized to predict the morphology of interfacial …

Combining multi-phase field simulation with neural network analysis to unravel thermomigration accelerated growth behavior of Cu6Sn5 IMC at cold side Cu–Sn …

A Kunwar, J Hektor, S Nomoto, YA Coutinho… - International Journal of …, 2020 - Elsevier
In Pb-free solder alloys used in solder balls of diameter of 50 µm or smaller, larger
proportion of Cu 6 Sn 5 intermetallics formation is a major reliability concern, and this is …

Scanning 3DXRD Measurement of Grain Growth, Stress, and Formation of Cu6Sn5 around a Tin Whisker during Heat Treatment

J Hektor, SA Hall, NA Henningsson, J Engqvist… - Materials, 2019 - mdpi.com
The 3D microstructure around a tin whisker, and its evolution during heat treatment were
studied using scanning 3DXRD. The shape of each grain in the sample was reconstructed …

Effect of Ni to the Cu substrate on the interfacial reaction with Sn-Cu solder

T Maeshima, H Ikehata, K Terui, Y Sakamoto - Materials & Design, 2016 - Elsevier
Both the formation of voids and the growth of a Cu 3 Sn layer were suppressed during
reactive diffusion between Sn-0.7% Cu solder and Ni added Cu substrates compared with …

Integration of machine learning with phase field method to model the electromigration induced Cu6Sn5 IMC growth at anode side Cu/Sn interface

A Kunwar, YA Coutinho, J Hektor, H Ma… - Journal of Materials …, 2020 - Elsevier
Currently, in the era of big data and 5G communication technology, electromigration has
become a serious reliability issue for the miniaturized solder joints used in microelectronic …

[HTML][HTML] Microstructural and mechanical characterization of Cu/Sn SLID bonding utilizing Co as contact metallization layer

F Emadi, V Vuorinen, S Mertin, K Widell… - Journal of Alloys and …, 2022 - Elsevier
Most micro-electro-mechanical systems (MEMS) devices contain fragile moving parts, which
poses challenges in process integration of interconnection methods requiring wet-chemistry …

Phase-field study of IMC growth in Sn–Cu/Cu solder joints including elastoplastic effects

A Durga, P Wollants, N Moelans - Acta Materialia, 2020 - Elsevier
In this article, we aim to study the problem of the growth of intermetallic phases in solder
joints undergoing mechanical deformation, using a phase-field model for multi-phase …

Phase field modelling combined with data-driven approach to unravel the orientation influenced growth of interfacial Cu6Sn5 intermetallics under electric current …

S Liang, C Wei, A Kunwar, U Subedi, H Jiang… - Surfaces and …, 2023 - Elsevier
Microstructure of interfacial intermetallics plays an important role in determining the service
performance and reliability of interconnects especially due to the anisotropic properties of …

[HTML][HTML] A level set approach to modelling diffusional phase transformations under finite strains with application to the formation of Cu6Sn5

E Jacobsson, H Hallberg, J Hektor, S Iyengar… - Computational Materials …, 2024 - Elsevier
This paper presents a sharp interface formulation for modelling diffusional phase
transformations. Grain boundary motion is, in accordance with diffusional phase …