Thermal-mechanical fatigue is one of the main failure modes for electronic systems,
particularly for high-density electronic systems with high-power components. Thermal …

Abstract LDMOS (laterally-diffused-metal-oxide-semiconductor) technology has been
studied rigorously for high power and high voltage applications in communication systems …

Extreme electro-thermal fatigue tests on power MOSFET-based switches for automotive
applications have been performed in order to pinpoint their failure mechanisms. Contrary to …

A method based on the failure analysis of power MOSFET devices tested under extreme
electrothermal fatigue is proposed. Failure modes are associated to several structural …

Extreme electro-thermal fatigue tests have been performed to failure on power MOSFET
devices that were later observed using electron and ion microcopy. At variance with devices …

This paper presents a synthesis of hot-electron effects on power RF LDMOS performances,
after accelerated ageing tests with electrical and/or thermal stress. Which can modify and …

Effective thermal management measures are of great significance for improving the
reliability of relay protection equipment. Firstly, the paper establishes a temperature …

This study presents firstly, experimental results through an innovative reliability bench of
pulsed RF life test in a radar application for device lifetime under pulse conditions, then the …

A crucial measure for the design of high-performance micro-resonators is to consider the
randomness of structural parameters when analyzing the structural system reliability. In this …

This paper focuses on exploring the correlation between electrical parameters shift of a
power RF N-LDMOS transistor and the failure phenomenon that appeared after the …