Degradation modeling based on a time-dependent ornstein-uhlenbeck process and residual useful lifetime estimation

Y Deng, A Barros, A Grall - IEEE Transactions on Reliability, 2015 - ieeexplore.ieee.org
In this paper, how to estimate residual useful lifetime (RUL) is discussed based on a model-
based method when fluctuations exist in the degradation process around its average …

Calculation of failure level based on inverse first passage problem

Y Deng, A Barros, A Grall - 2014 Reliability and Maintainability …, 2014 - ieeexplore.ieee.org
In real cases, the definition of failure sometimes seems ambiguous although boundary-
crossing failures are widely accepted in data-analysis work. Usually we don't have really …

Degradation modeling based on a time-dependent Ornstein-Uhlenbeck process and prognosis of system failures

Y Deng - 2015 - theses.hal.science
This thesis is dedicated to describe, predict and prevent system failures. It consists of four
issues: i) stochastic degradation modeling, ii) prognosis of system failures, iii) failure level …