Wide-bandgap semiconductor ultraviolet photodetectors

E Monroy, F Omnès, F Calle - Semiconductor science and …, 2003 - iopscience.iop.org
Industries such as the automotive, aerospace or military, as well as environmental and
biological research have promoted the development of ultraviolet (UV) photodetectors …

Insulated gate and surface passivation structures for GaN-based power transistors

Z Yatabe, JT Asubar, T Hashizume - Journal of Physics D …, 2016 - iopscience.iop.org
Recent years have witnessed GaN-based devices delivering their promise of
unprecedented power and frequency levels and demonstrating their capability as an able …

Electronic surface and dielectric interface states on GaN and AlGaN

BS Eller, J Yang, RJ Nemanich - … of Vacuum Science & Technology A, 2013 - pubs.aip.org
GaN and AlGaN have shown great potential in next-generation high-power electronic
devices; however, they are plagued by a high density of interface states that affect device …

Analysis of reverse-bias leakage current mechanisms in GaN grown by molecular-beam epitaxy

EJ Miller, ET Yu, P Waltereit, JS Speck - Applied physics letters, 2004 - pubs.aip.org
Temperature-dependent current–voltage measurements have been used to determine the
reverse-bias leakage current mechanisms in Schottky diodes fabricated on GaN grown by …

Leakage mechanism in GaN and AlGaN Schottky interfaces

T Hashizume, J Kotani, H Hasegawa - Applied Physics Letters, 2004 - pubs.aip.org
Based on detailed temperature-dependent current–voltage (I–V–T) measurements the
mechanism of leakage currents through GaN and AlGaN Schottky interfaces is discussed …

Gate leakage current mechanisms in AlGaN/GaN heterostructure field-effect transistors

EJ Miller, XZ Dang, ET Yu - Journal of applied Physics, 2000 - pubs.aip.org
Gate leakage currents in AlGaN/GaN heterostructure field-effect transistor (HFET) structures
with conventional and polarization-enhanced barriers have been studied. Comparisons of …

[BOOK][B] Handbook of nitride semiconductors and devices, GaN-based optical and electronic devices

H Morkoç - 2009 - books.google.com
The three volumes of this handbook treat the fundamentals, technology and nanotechnology
of nitride semiconductors with an extraordinary clarity and depth. They present all the …

Barrier inhomogeneity and electrical properties of Pt∕ GaN Schottky contacts

F Iucolano, F Roccaforte, F Giannazzo… - Journal of Applied …, 2007 - pubs.aip.org
The temperature dependence of the electrical properties of Pt∕ Ga N Schottky barrier was
studied. In particular, a Schottky barrier height of 0.96 eV and an ideality factor of 1.16 were …

Dependence of Ni/AlGaN Schottky barrier height on Al mole fraction

D Qiao, LS Yu, SS Lau, JM Redwing, JY Lin… - Journal of Applied …, 2000 - pubs.aip.org
The dependence of the Schottky barrier height of Ni/Al x Ga 1− x N contact on the Al mole
fraction up to x= 0.23 was studied. The barrier heights were measured by I–V, capacitance …

Graphene-based transparent conductive electrodes for GaN-based light emitting diodes: Challenges and countermeasures

L Wang, W Liu, Y Zhang, ZH Zhang, ST Tan, X Yi… - Nano Energy, 2015 - Elsevier
Graphene, with attractive electrical, optical, mechanical and thermal properties, is
considered to be an ideal candidate for transparent conductive electrodes (TCEs) in many …