Polarization assisted self-powered GaN-based UV photodetector with high responsivity

J Wang, C Chu, K Tian, J Che, H Shao, Y Zhang… - Photonics …, 2021‏ - opg.optica.org
In this work, a self-powered GaN-based metal-semiconductor-metal photodetector (MSM
PD) with high responsivity has been proposed and fabricated. The proposed MSM PD forms …

Degradation of InGaN-based LEDs: Demonstration of a recombination-dependent defect-generation process

N Renso, C De Santi, A Caria, F Dalla Torre… - Journal of Applied …, 2020‏ - pubs.aip.org
This paper provides insights into the degradation of InGaN-based LEDs by presenting a
comprehensive analysis carried out on devices having two quantum wells (QWs) with …

Improved minority carrier lifetime in p-type GaN segments prepared by vacancy-guided redistribution of Mg

K Shima, R Tanaka, S Takashima, K Ueno… - Applied Physics …, 2021‏ - pubs.aip.org
To accelerate the development of GaN power devices, reproducible fabrication of p-type
GaN (p-GaN) segments by ion-implantation (I/I) that enables selective-area do** is …

[HTML][HTML] Impacts of vacancy complexes on the room-temperature photoluminescence lifetimes of state-of-the-art GaN substrates, epitaxial layers, and Mg-implanted …

SF Chichibu, K Shima, A Uedono, S Ishibashi… - Journal of Applied …, 2024‏ - pubs.aip.org
For rooting the development of GaN-based optoelectronic devices, understanding the roles
of midgap recombination centers (MGRCs), namely, nonradiative recombination centers and …

Improved midgap recombination lifetimes in GaN crystals grown by the low-pressure acidic ammonothermal method

K Shima, K Kurimoto, Q Bao, Y Mikawa, M Saito… - Applied Physics …, 2024‏ - pubs.aip.org
To investigate the carrier recombination processes in GaN crystals grown by the low-
pressure acidic ammonothermal (LPAAT) method, the photoluminescence (PL) spectra and …

Enhanced activation of Mg ion-implanted GaN at decreasing annealing temperature by prolonging duration

T Nakashima, E Kano, K Kataoka, S Arai… - Applied Physics …, 2020‏ - iopscience.iop.org
Defect time-evolution was investigated in Mg ion-implanted GaN after annealing at 1573 K
for an unprecedentedly long duration. Transmission electron microscopy directly revealed …

Electron lifetime and diffusion coefficient in dopant-free p-type distributed polarization doped AlGaN

T Kumabe, S Kawasaki, H Watanabe, Y Honda… - Applied Physics …, 2023‏ - pubs.aip.org
Minority carrier properties in dopant-free p-type distributed polarization doped (DPD) AlGaN
layers were investigated on the basis of the forward-biased current density–voltage (J–V) …

Substitutional diffusion of Mg into GaN from GaN/Mg mixture

Y Itoh, S Lu, H Watanabe, M Deki, S Nitta… - Applied Physics …, 2022‏ - iopscience.iop.org
We evaluated Mg-diffusion into GaN from GaN/Mg mixture. The diffusion depth of Mg
increased with diffusion temperature from 1100 C to 1300 C, whereas the Mg concentration …

Investigation on minority carrier lifetime, diffusion length and recombination mechanism of Mg-doped GaN grown by MOCVD

J Wang, X Wang, J Chen, X Gao, X Zeng, H Mao… - Journal of Alloys and …, 2021‏ - Elsevier
Minority carrier lifetime and diffusion length are important parameters for GaN based
material and devices. In this work, we obtained the minority carrier lifetime and diffusion …

Isolation of bidimensional electron gas in AlGaN/GaN heterojunction using Ar ion implantation

A Scandurra, M Testa, G Franzò, G Greco… - Materials Science in …, 2023‏ - Elsevier
Gallium nitride (GaN) has superior physical properties suitable for the realization of power
switching and high-frequency transistors with better performances than of conventional Si …