As of 2013, the gold standard for assessing radiation-hardness assurance (RHA) for a
system, subsystem, or a component is accelerated radiation testing and/or pulsed laser …

Radiation-induced multiple event transients (METs) are expected to become more frequent
than single event transients (SETs) at nanoscale CMOS technology nodes. In this paper, a …

As the technology scales down, space radiation induced soft errors are becoming a critical
issue for the reliability of Integrated Circuits (ICs). In this paper, we propose a novel layout …

Radiation-induced single event transients (SETs) are expected to evolve to single event
multiple transients (SEMTs) due to the downscaling of transistor feature size, which also …

Radiation-induced single transient faults (STFs) are expected to evolve into multiple
transient faults (MTFs) at nanoscale CMOS technology nodes. For this reason, the reliability …

This paper presents a methodology to reduce the impact of double faults in a circuit by
constraining the placement of its standard cells. A fault-injection emulation platform is used …

As fabrication technology scales towards smaller transistor sizes, lower critical charge, and
higher operating frequencies, single-event radiation effects are more likely to cause errant …

Integrity assurance of configuration data has a significant impact on microcontroller-based
systems reliability. This is especially true when running applications driven by events which …

A novel constrained layout placement approach is proposed to enhance the pulse
quenching effect in combinational circuits. This constrained algorithm can enlarge the …

The design methodology based on standard cells is widely used in a broad range of very-
large-scale integration (VLSI) applications. Furthermore, several optimization algorithms can …