Testing strategies for networks on chip

R Ubar, J Raik - Networks on chip, 2003 - Springer
The complexity of Networks-on-Chip (NoC) makes the application of traditional test methods
obsolete. For NoC, a combination of methods known from the System-on-Chip, memory and …

Design-for-testability-based external test and diagnosis of mesh-like network-on-a-chips

J Raik, V Govind, R Ubar - IET computers & digital techniques, 2009 - IET
The study proposes a new concept of test and diagnosis in regular mesh-like network-on-a-
chip (NoC) designs. The method is based on functional fault models and it implements …

Structural fault collapsing by superposition of BDDs for test generation in digital circuits

R Ubar, D Mironov, J Raik… - 2010 11th International …, 2010 - ieeexplore.ieee.org
The paper presents a new structural fault-independent fault collapsing method based on the
topology analysis of the circuit, which has linear complexity. The minimal necessary set of …

Overview about low-level and high-level decision diagrams for diagnostic modeling of digital systems

R Ubar - Facta universitatis-series: Electronics and Energetics, 2011 - doiserbia.nb.rs
BDDs have become the state-of-the-art data structure in VLSI CAD. In this paper, a special
class of BDDs is presented called Structurally Synthesized BDDs (SSBDD). The idea of …

Code coverage analysis using high-level decision diagrams

J Raik, U Reinsalu, R Ubar, M Jenihhin… - 2008 11th IEEE …, 2008 - ieeexplore.ieee.org
The paper proposes a novel method of analyzing code coverage metrics on a system
representation called high-level decision diagrams (HLDD). Previous works have shown …

[PDF][PDF] Canonical representations of high-level decision diagrams.

A Karputkin, R Ubar, J Raik, M Tombak - Estonian Journal of Engineering, 2010 - kirj.ee
In this paper we give a short overview of the decision diagrams, and define a special class of
high-level decision diagrams (HLDD) for formal representation of digital systems. We show …

Synthesis of high-level decision diagrams for functional test pattern generation

R Ubar, J Raik, A Karputkin… - 2009 MIXDES-16th …, 2009 - ieeexplore.ieee.org
In this paper we present two methods for synthesis of high-level decision diagrams (HLDD)
for representing digital systems at higher behavior, functional or register-transfer levels. The …

Internet-based Collaborative Test Generation with MOSCITO

A Schneider, E Ivask, P Miklos, J Raik… - … Automation and Test …, 2002 - ieeexplore.ieee.org
This paper offers an Internet-based environment for enhancing problem-specific design
flows with test pattern generation and fault simulation capabilities. Automatic Test Pattern …

Diagnostic modeling of digital systems with multi-level decision diagrams

R Ubar, J Raik, A Jutman, M Jenihhin - Design and Test Technology …, 2011 - igi-global.com
In order to cope with the complexity of today's digital systems in diagnostic modeling,
hierarchical multi-level approaches should be used. In this chapter, the possibilities of using …

Temporally extended high-level decision diagrams for PSL assertions simulation

M Jenihhin, J Raik, A Chepurov… - 2008 13th European Test …, 2008 - ieeexplore.ieee.org
The paper proposes a novel method for PSL language assertions simulation-based
checking. The method uses a system representation model called High-level decision …