Resistive random access memory (RRAM): an overview of materials, switching mechanism, performance, multilevel cell (MLC) storage, modeling, and applications

F Zahoor, TZ Azni Zulkifli, FA Khanday - Nanoscale research letters, 2020‏ - Springer
In this manuscript, recent progress in the area of resistive random access memory (RRAM)
technology which is considered one of the most standout emerging memory technologies …

Advanced Data Encryption​ using 2D Materials

C Wen, X Li, T Zanotti, FM Puglisi, Y Shi… - Advanced …, 2021‏ - Wiley Online Library
Advanced data encryption requires the use of true random number generators (TRNGs) to
produce unpredictable sequences of bits. TRNG circuits with high degree of randomness …

Insight into physics‐based RRAM models–review

A Lekshmi Jagath, C Hock Leong… - The Journal of …, 2019‏ - Wiley Online Library
This article presents a review of physical, analytical, and compact models for oxide‐based
RRAM devices. An analysis of how the electrical, physical, and thermal parameters affect …

Memristor variability and stochastic physical properties modeling from a multivariate time series approach

FJ Alonso, D Maldonado, AM Aguilera… - Chaos, Solitons & …, 2021‏ - Elsevier
A powerful time series analysis modeling technique is presented to describe cycle-to-cycle
variability in memristors. These devices show variability linked to the inherent stochasticity of …

The Electrode‐Ferroelectric interface as the primary constraint on endurance and retention in HZO‐Based ferroelectric capacitors

R Alcala, M Materano, PD Lomenzo… - Advanced functional …, 2023‏ - Wiley Online Library
Ferroelectric hafnium‐zirconium oxide is one of the most relevant CMOS‐compatible
materials for next‐generation, non‐volatile memory devices. Nevertheless, performance …

Experimental study of the series resistance effect and its impact on the compact modeling of the conduction characteristics of HfO2-based resistive switching memories

D Maldonado, F Aguirre, G González-Cordero… - Journal of Applied …, 2021‏ - pubs.aip.org
The relevance of the intrinsic series resistance effect in the context of resistive random
access memory (RRAM) compact modeling is investigated. This resistance notably affects …

: a physical model for RRAM devices simulation

MA Villena, JB Roldán, F Jiménez-Molinos… - Journal of …, 2017‏ - Springer
In the last few years, resistive random access memory (RRAM) has been proposed as one of
the most promising candidates to overcome the current Flash technology in the market of …

Investigation of the multilevel capability of TiN/Ti/HfO2/W resistive switching devices by sweep and pulse programming

S Poblador, MB Gonzalez, F Campabadal - Microelectronic Engineering, 2018‏ - Elsevier
Multilevel states are clearly distinguished in TiN/Ti/HfO 2/W RRAM devices by programming
sequential voltage ramps and trains of pulses. It has been shown that the filamentary …

Kinetic Monte Carlo analysis of data retention in Al: HfO2-based resistive random access memories

S Aldana, E Pérez, F Jiménez-Molinos… - Semiconductor …, 2020‏ - iopscience.iop.org
Abstract Kinetic Monte Carlo resistive random access memory simulations are used to
understand different retention experiments performed at several temperatures. The physics …

[HTML][HTML] Ternary encoder and decoder designs in RRAM and CNTFET technologies

SU Haq, VK Sharma - e-Prime-Advances in Electrical Engineering …, 2024‏ - Elsevier
A possible way for the very large scale integration (VLSI) industry to keep up with the pace of
high density, computational capability, and energy efficiency is to look into some …