Crystal grain nucleation in amorphous silicon
The solid phase crystallization of chemical vapor deposited amorphous silicon films onto
oxidized silicon wafers, induced either by thermal annealing or by ion beam irradiation at …
oxidized silicon wafers, induced either by thermal annealing or by ion beam irradiation at …
Ion-beam-induced epitaxial crystallization and amorphization in silicon
The ion-beam-induced epitaxial crystallization (IBIEC) and planar amorphization of
amorphous Si (a-Si) layers onto single-crystal Si substrates is reviewed. In particular, the …
amorphous Si (a-Si) layers onto single-crystal Si substrates is reviewed. In particular, the …
Ion-beam-induced amorphization and recrystallization in silicon
Ion-beam-induced amorphization in Si has attracted significant interest since the beginning
of the use of ion implantation for the fabrication of Si devices. A number of theoretical …
of the use of ion implantation for the fabrication of Si devices. A number of theoretical …
Ion beams in silicon processing and characterization
General trends in integrated circuit technology toward smaller device dimensions, lower
thermal budgets, and simplified processing steps present severe physical and engineering …
thermal budgets, and simplified processing steps present severe physical and engineering …
[BOOK][B] Ion implantation: basics to device fabrication
E Rimini - 1994 - books.google.com
Ion implantation offers one of the best examples of a topic that starting from the basic
research level has reached the high technology level within the framework of …
research level has reached the high technology level within the framework of …
Ion-beam induced damage and annealing behaviour in SiC
E Wendler, A Heft, W Wesch - Nuclear Instruments and Methods in Physics …, 1998 - Elsevier
The paper presents the damage accumulation in silicon carbide (SiC) as a function of the
ion mass, the ion energy and the implantation temperature. A defect-interaction and …
ion mass, the ion energy and the implantation temperature. A defect-interaction and …
Nuclear tracks in solids: registration physics and the compound spike
LT Chadderton - Radiation measurements, 2003 - Elsevier
Observations of GeV heavy ion and MeV cluster-ion tracks in crystalline solids give us new
insight into registration physics. Thermal and ion explosion spikes no longer compete; a …
insight into registration physics. Thermal and ion explosion spikes no longer compete; a …
Growth and relaxation mechanisms of YBa2Cu3O7− x films
SJ Pennycook, MF Chisholm, DE Jesson… - Physica C …, 1992 - Elsevier
Using a combination of Z-contrast scanning transmission electron microscopy, scanning
tunneling microscopy, and plan view diffraction contrast imaging, we have studied the …
tunneling microscopy, and plan view diffraction contrast imaging, we have studied the …
Superplastic nanoscale pore sha** by ion irradiation
Exposed to ionizing radiation, nanomaterials often undergo unusual transformations
compared to their bulk form. However, atomic-level mechanisms of such transformations are …
compared to their bulk form. However, atomic-level mechanisms of such transformations are …
Crystalline-to-amorphous transition for Si-ion irradiation of Si (100)
Silicon (100) crystals are implanted with 1-MeV Si 2+ ions to a fixed fluence of 1× 10 15
ions/cm 2 at systematically different incident-ion dose rates, R, and substrate temperatures …
ions/cm 2 at systematically different incident-ion dose rates, R, and substrate temperatures …