Force measurements with the atomic force microscope: Technique, interpretation and applications
The atomic force microscope (AFM) is not only a tool to image the topography of solid
surfaces at high resolution. It can also be used to measure force-versus-distance curves …
surfaces at high resolution. It can also be used to measure force-versus-distance curves …
Effects of confinement on material behaviour at the nanometre size scale
In this article, the effects of size and confinement at the nanometre size scale on both the
melting temperature, T m, and the glass transition temperature, T g, are reviewed. Although …
melting temperature, T m, and the glass transition temperature, T g, are reviewed. Although …
Advances in atomic force microscopy for probing polymer structure and properties
D Wang, TP Russell - Macromolecules, 2018 - ACS Publications
Over the past 30 years, atomic force microscopy (AFM) has played an important role in
elucidating the structure and properties of polymer surfaces. AFM-based techniques have …
elucidating the structure and properties of polymer surfaces. AFM-based techniques have …
Effect of interfacial interactions on the glass transition of polymer thin films
Previous studies had demonstrated that the T g of polymer thin films is strongly dependent
on the interactions, γs, between the polymer and the underlying substrate. We present a …
on the interactions, γs, between the polymer and the underlying substrate. We present a …
Surface dynamics of glasses
Two challenging scientific disciplines, ie, the physics of glasses [Anderson, Science 267,
1615 (1995); Kennedy and Norman, Science 309, 75 (2005)] and interface chemistry …
1615 (1995); Kennedy and Norman, Science 309, 75 (2005)] and interface chemistry …
Mechanical characterization of polymers on a nanometer scale through nanoindentation. A study on pile-up and viscoelasticity
The analysis of nanoindentation force curves collected on polymers through the common
Oliver and Pharr procedure does not lead to a correct evaluation of Young's modulus. In …
Oliver and Pharr procedure does not lead to a correct evaluation of Young's modulus. In …
Study of elastic modulus and yield strength of polymer thin films using atomic force microscopy
B Du, OKC Tsui, Q Zhang, T He - Langmuir, 2001 - ACS Publications
Nanometer-scale elastic moduli and yield strengths of polycarbonate (PC) and polystyrene
(PS) thin films were measured with atomic force microscopy (AFM) indentation …
(PS) thin films were measured with atomic force microscopy (AFM) indentation …
Nanoscale mechanical characterization of polymers by AFM nanoindentations: critical approach to the elastic characterization
AFM nanoindentations show a dependence of penetration, ie, the relative motion between
the sample and the tip (indenter), on material elastic properties when using the same load …
the sample and the tip (indenter), on material elastic properties when using the same load …
Thickness dependence of the Young's modulus of polymer thin films
The Young's modulus of polymer thin films was measured from bulk films that are
micrometers in thickness down to films having a thickness of∼ 6 nm, which is less than the …
micrometers in thickness down to films having a thickness of∼ 6 nm, which is less than the …
Stretching and Bending Moduli of Bilayer Films Inferred from Wrinkle Patterns
Wrinkling patterns were used to investigate the mechanical properties of thin poly
(styrene)(PS)/poly (methyl methacrylate)(PMMA) and PS/gold (Au) bilayer films. Films were …
(styrene)(PS)/poly (methyl methacrylate)(PMMA) and PS/gold (Au) bilayer films. Films were …