Temperature as an accelerating factor for lifetime estimation of RF-MEMS switches
In satellite applications the devices have to retain their functionality for years and this
requirement necessitate of reliable methodologies to predict the switch lifetime. At present, a …
requirement necessitate of reliable methodologies to predict the switch lifetime. At present, a …
A novel technique to alleviate the stiction phenomenon in radio frequency microelectromechanical switches
Radio frequency (RF) microelectromechanical system (MEMS) switches subject to long term
actuation suffer from narrowing of the actuation and release voltages. This can lead to the …
actuation suffer from narrowing of the actuation and release voltages. This can lead to the …
Viscoelasticity recovery mechanism in radio frequency microelectromechanical switches
Radio frequency microelectromechanical system (RF MEMS) switches require a lifetime of
20 years, during which the devices must operate without failure. During operation, the RF …
20 years, during which the devices must operate without failure. During operation, the RF …
Reliability assessment of MEMS switches for space applications: laboratory and launch testing
A novel combination of ground-based and flight tests was employed to examine the
reliability of capacitive radio-frequency microelectromechanical switches for use in space …
reliability of capacitive radio-frequency microelectromechanical switches for use in space …
Electric-field-controlled optical switch using Kerr effect and gradient of the composition ratio Nb/(Ta+ Nb)
D Gong, Y Liang, W Ou, J Wang, Y Wu, B Liu… - Materials Research …, 2016 - Elsevier
By exploiting the Kerr effect and the gradient of the composition ratio m, Nb/(Ta+ Nb) in
mol%, in KTa 1− x Nb x O 3 (KTN) crystals, we have designed an electric-field-controlled …
mol%, in KTa 1− x Nb x O 3 (KTN) crystals, we have designed an electric-field-controlled …
Clear evidence of mechanical deformation in RF-MEMS switches during prolonged actuation
V Mulloni, G Resta, B Margesin - Journal of Micromechanics and …, 2014 - iopscience.iop.org
Dielectric charging is normally considered one of the most important problems when dealing
with RF-MEMS switch reliability, especially for applications which require long-term …
with RF-MEMS switch reliability, especially for applications which require long-term …
Preconditioning procedure for the better estimation of the long-term lifetime in microelectromechanical switches
The study of long-term reliability of RF-MEMS switches subjected to continuous biasing
involves different failure mechanisms: 1) short-to-medium-term stress inducing permanent …
involves different failure mechanisms: 1) short-to-medium-term stress inducing permanent …
Transient evolution of mechanical and electrical effects in microelectromechanical switches subjected to long-term stresses
Application of two different biasing waveforms in long-term stresses in RF MEMS switches is
used to separate mechanical and electrical effects. Three different effects are shown: 1) …
used to separate mechanical and electrical effects. Three different effects are shown: 1) …
An accelerated thermal cycling test for RF-MEMS switches
V Mulloni, G Sordo, B Margesin - Microsystem Technologies, 2016 - Springer
Thermal cycling tests are an important part of the standard space qualification procedure for
RF-MEMS devices. Standardized tests are rather demanding in terms of equipment, sample …
RF-MEMS devices. Standardized tests are rather demanding in terms of equipment, sample …
Identification of the transient stress-induced leakage current in silicon dioxide films for use in microelectromechanical systems capacitive switches
Dielectric charging at low electric fields is characterized on radio-frequency
microelectromechanical systems (RF MEMS) capacitive switches. The dielectric under …
microelectromechanical systems (RF MEMS) capacitive switches. The dielectric under …