The structure of disordered materials is still not well understood because of insufficient
experimental data. Indeed, diffraction patterns from disordered materials are very broad and …

The pressure-driven collapse in the structure of network-forming materials will be
considered in the gigapascal (GPa) regime, where the development of in situ high-pressure …

A summary is given of the partial structure factors that have been measured for liquids and
glasses in the Ge–Se binary system by using diffraction methods. Information is presented …

In order to explore local-and intermediate-range atomic structures of several semiconducting
and metallic glasses, anomalous X-ray scattering (AXS) experiments were performed using …

The microscopic origin of the intermediate phase in two prototypical covalently bonded A x B
1− x network glass forming systems, where A= Ge or Si, B= Se, and 0≤ x≤ 1, was …

Anomalous x-ray scattering experiments on glassy Ge x Se 1− x were carried out at energies
close to the Ge and Se K absorption edges at concentrations between x= 0.15 and 0.333 in …

With the advent of third-generation synchrotron sources and the development of light source
techniques, X-ray scattering techniques have become feasible, leading to new approaches …

The structure of amorphous Cu 2 GeTe 3 is investigated by a combination of anomalous x-
ray scattering and extended x-ray absorption fine-structure experiments. The experimental …

To understand the relation of the glass-forming ability (GFA) to the local atomic
configurations of a Pd 42.5 Ni 7.5 Cu 30 P 20 (PNCP) metallic glass having the best GFA at …

We have investigated amorphous GeTe by anomalous X‐ray scattering coupled with
reverse Monte Carlo modeling. Experiments were conducted at the two K‐absorption edges …