Physical unclonable functions (PUFs) have emerged as a promising security primitive for
low-cost authentication and cryptographic key generation. However, PUF stability with …

This book focuses on modeling, simulation and analysis of analog circuit aging. First, all
important nanometer CMOS physical effects resulting in circuit unreliability are reviewed …

Variations in process parameters affect the operation of integrated circuits (ICs) and pose a
significant threat to the continued scaling of transistor dimensions. Such parameter …

Negative bias temperature instability (NBTI) in PMOS transistors has become a major
reliability concern in present-day digital circuit design. Further, with the recent usage of Hf …

Negative bias temperature instability (NBTI) in pMOS transistors has become a major
reliability concern in present-day digital circuit design. Further, with the recent introduction of …

This experimental study focuses on the positive bias temperature instability (PBTI) in a fully
recessed-gate AlGaN/GaN MOS-HEMT. A positive stress voltage to the gate results in …

Abstract Physically Unclonable Functions (PUFs) are mainly used for generating unique
keys to identify electronic devices. These entities mainly benefit from the process variations …

Vulnerability of cryptographic devices to side-channel analysis attacks, and in particular
power analysis attacks has been extensively studied in the recent years. Among them, static …

In this paper, complementary measurements of the drain and the gate low-frequency noise
are used as a powerful probe for sensing the hafnium-related defects in nMOSFETs with …

Bias temperature instability is a common relia-bility issue in Metal Oxide Semiconductor
Field Effect Transistors used in silicon integrated circuits. When transferred to in-dustrial …