A general introduction to surface and interfacial forces, perfectly combining theoretical
concepts, experimental techniques and practical applications. In this completely updated …

Введение. В 1981 году Герхард Бинниг и Хайнрих Рёрер из лаборатории IBM в Цюрихе
представили миру сканирующий туннельный микроскоп (СТМ). С его помощью были …

The original Handbook of Surface and Interface Analysis: Methods for Problem-Solving was
based on the authors' firm belief that characterization and analysis of surfaces should be …

Many papers have been published on methods to determine the normal spring constant, kz,
of atomic force microscope (AFM) cantilevers. This is necessary to calibrate force …

The analysis of lateral force microscopy experiments is discussed with emphasis on
calibration issues and the statistical treatment of the original data in order to obtain reliable …

This paper outlines a procedure for the calibration of the lateral force applied to a triangular
cantilever tip by means of a lateral force microscope. The force is directed perpendicular to …

A non-destructive technique is presented for verifying torsional spring constants used in
lateral force microscopy. Various calibrations of the microscope are required and these are …

The quantitative determination of friction forces by atomic force microscopy (AFM) in
nanotribology requires the conversion of the output voltage signal of the sector area …

Scanning probe microscopy is a family of techniques which provide images of the surface
topography and, in some cases surface properties, on the atomic scale. Since its inception in …

A combination of finite element analysis (FEA) calculations and resonant frequency
measurements are applied for determining the normal and lateral spring constants of …