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[PDF][PDF] Сканирующие зондовые микроскопы (обзор)
АА Суслов, СА Чижик - Материалы, технологии, инструменты, 1997 - microtm.narod.ru
Введение. В 1981 году Герхард Бинниг и Хайнрих Рёрер из лаборатории IBM в Цюрихе
представили миру сканирующий туннельный микроскоп (СТМ). С его помощью были …
представили миру сканирующий туннельный микроскоп (СТМ). С его помощью были …
[ספר][B] Surface and interfacial forces
A general introduction to surface and interfacial forces, perfectly combining theoretical
concepts, experimental techniques and practical applications. In this completely updated …
concepts, experimental techniques and practical applications. In this completely updated …
[ספר][B] Handbook of surface and interface analysis: methods for problem-solving
JC Riviere, S Myhra - 2009 - taylorfrancis.com
The original Handbook of Surface and Interface Analysis: Methods for Problem-Solving was
based on the authors' firm belief that characterization and analysis of surfaces should be …
based on the authors' firm belief that characterization and analysis of surfaces should be …
The determination of atomic force microscope cantilever spring constants via dimensionalmethods for nanomechanical analysis
Many papers have been published on methods to determine the normal spring constant, kz,
of atomic force microscope (AFM) cantilevers. This is necessary to calibrate force …
of atomic force microscope (AFM) cantilevers. This is necessary to calibrate force …
Quantitative analysis of lateral force microscopy experiments
The analysis of lateral force microscopy experiments is discussed with emphasis on
calibration issues and the statistical treatment of the original data in order to obtain reliable …
calibration issues and the statistical treatment of the original data in order to obtain reliable …
Calibration procedures for frictional measurements with a lateral force microscope
This paper outlines a procedure for the calibration of the lateral force applied to a triangular
cantilever tip by means of a lateral force microscope. The force is directed perpendicular to …
cantilever tip by means of a lateral force microscope. The force is directed perpendicular to …
Spring constants of composite ceramic/gold cantilevers for scanning probe microscopy
A combination of finite element analysis (FEA) calculations and resonant frequency
measurements are applied for determining the normal and lateral spring constants of …
measurements are applied for determining the normal and lateral spring constants of …
Quantitative nanotribology by AFM: a novel universal calibration platform
The quantitative determination of friction forces by atomic force microscopy (AFM) in
nanotribology requires the conversion of the output voltage signal of the sector area …
nanotribology requires the conversion of the output voltage signal of the sector area …
Tip friction—torsional spring constant determination
A non-destructive technique is presented for verifying torsional spring constants used in
lateral force microscopy. Various calibrations of the microscope are required and these are …
lateral force microscopy. Various calibrations of the microscope are required and these are …
Scanning probe microscopy
Scanning probe microscopy is a family of techniques which provide images of the surface
topography and, in some cases surface properties, on the atomic scale. Since its inception in …
topography and, in some cases surface properties, on the atomic scale. Since its inception in …