Challenges and opportunities in advanced Ge pMOSFETs

E Simoen, J Mitard, G Hellings, G Eneman… - Materials Science in …, 2012 - Elsevier
This paper aims at reviewing the state-of-the art of Ge pMOSFETs for future high-
performance CMOS devices. Key in the development is the integration of a Ge channel on a …

GaAs/GeSn/Ge n–i–p diodes and light emitting diodes formed via grafting

J Zhou, H Wang, PR Huang, S Xu, Y Liu… - Journal of Vacuum …, 2024 - pubs.aip.org
Germanium-tin (GeSn) is a promising semiconductor material for future optoelectronic
devices operating at the near-infrared to mid-infrared spectral range. In this work, we report …

Theoretical investigation of performance enhancement in GeSn/SiGeSn type-II staggered heterojunction tunneling FET

H Wang, G Han, Y Liu, S Hu, C Zhang… - … on Electron Devices, 2015 - ieeexplore.ieee.org
We design a GeSn/SiGeSn type-II staggered heterojunction n-channel tunneling FET
(hetero-NTFET). The energy band structures of GeSn and SiGeSn alloys were calculated by …

Heteroepitaxial growth of Sn-related group-IV materials on Si platform for microelectronic and optoelectronic applications: Challenges and Opportunities

O Nakatsuka, N Taoka, T Asano, T Yamaha… - Ecs …, 2013 - iopscience.iop.org
We have examined the heteroepitaxial growth of Ge1-xSnx and Ge1-xy SixSny layers and
investigated the crystalline and electrical properties of these Sn-related group-IV material …

Characterization of crystalline GeSn layer on tensile-strained Ge buffer deposited by magnetron sputtering

Y Miao, Y Wang, H Hu, X Liu, H Su, J Zhang… - Materials Science in …, 2018 - Elsevier
High-quality low Sn-content GeSn film has been grown on tensile strained Ge/Si (100)
substrate using a physical vapor deposition reactor and no subsequent annealing was …

Thermoelectric power factor of Ge1-xSnx thin films

A Portavoce, H Khelidj, N Oueldna, S Amhil… - Materialia, 2020 - Elsevier
The Seebeck coefficients (α) and the power factors of 100 nm-thick Ge 1-x Sn x films grown
by magnetron sputtering were studied versus Sn composition (0.09≤ x≤ 0.15) in the 220 …

Identification of deep levels associated with extended and point defects in GeSn epitaxial layers using DLTS

S Gupta, E Simoen, H Vrielinck, C Merckling… - ECS …, 2013 - iopscience.iop.org
Deep levels associated with extended and point defects in MOS capacitors fabricated on
unintentionally doped GeSn epitaxial layers on Ge-on-Si substrates have been studied by …

Theoretical calculation of performance enhancement in lattice-matched SiGeSn/GeSn p-channel tunneling field-effect transistor with type-II staggered tunneling …

H Wang, G Han, Y Wang, Y Peng, Y Liu… - Japanese Journal of …, 2016 - iopscience.iop.org
In this work, a lattice-matched SiGeSn/GeSn heterostructure p-channel tunneling field-effect
transistor (hetero-PTFET) with a type-II staggered tunneling junction (TJ) is investigated …

Grafted AlGaAs/GeSn Optical Pum** Laser Operating up to 130 K

J Zhou, D Vincent, S Acharya, S Ojo, A Abrand… - arxiv preprint arxiv …, 2024 - arxiv.org
Group IV GeSn double-heterostructure (DHS) lasers offer unique advantages of a direct
bandgap and CMOS compatibility. However, further improvements in laser performance …

Epitaxial growth of GeSn layers on (001),(110), and (111) Si and Ge substrates

O Nakatsuka, N Taoka, T Asano, T Yamaha… - ECS …, 2014 - iopscience.iop.org
We have examined the epitaxial growth of Ge1-Snx on Ge (001), Ge (110), Ge (111), and Si
(110) substrates and have investigated the crystalline properties of the epitaxial layers. We …