Prospects of III-nitride optoelectronics grown on Si

D Zhu, DJ Wallis, CJ Humphreys - Reports on Progress in …, 2013 - iopscience.iop.org
The use of III-nitride-based light-emitting diodes (LEDs) is now widespread in applications
such as indicator lamps, display panels, backlighting for liquid-crystal display TVs and …

AlGaN devices and growth of device structures

KA Jones, TP Chow, M Wraback, M Shatalov… - Journal of Materials …, 2015 - Springer
The structure of a number of GaN/AlGaN devices and their associated material growth and
processing issues are examined in some detail, and extrapolations are made to predict what …

[HTML][HTML] Do** and compensation in Al-rich AlGaN grown on single crystal AlN and sapphire by MOCVD

I Bryan, Z Bryan, S Washiyama, P Reddy… - Applied Physics …, 2018 - pubs.aip.org
In order to understand the influence of dislocations on do** and compensation in Al-rich
AlGaN, thin films were grown by metal organic chemical vapor deposition (MOCVD) on …

Stress relaxation in mismatched layers due to threading dislocation inclination

AE Romanov, JS Speck - Applied Physics Letters, 2003 - pubs.aip.org
A recently observed mechanism of elastic stress relaxation in mismatched layers is
discussed. The relaxation is achieved by the inclination of pure edge threading dislocation …

Strain relaxation in AlGaN multilayer structures by inclined dislocations

DM Follstaedt, SR Lee, AA Allerman… - Journal of Applied …, 2009 - pubs.aip.org
To examine further the strain relaxation produced by inclined threading dislocations in
AlGaN, a heterostructure with three AlGaN layers having successively increasing Ga …

Growth of blue GaN LED structures on 150-mm Si (1 1 1)

A Dadgar, C Hums, A Diez, J Bläsing, A Krost - Journal of Crystal Growth, 2006 - Elsevier
Up to 5.4-μm thick GaN on Si light emitting diode (LED) structures were grown by
metalorganic chemical vapor phase epitaxy (MOVPE) on 150mm Si (111) substrates. In-situ …

Role of inclined threading dislocations in stress relaxation in mismatched layers

P Cantu, F Wu, P Waltereit, S Keller… - Journal of Applied …, 2005 - pubs.aip.org
(0001)-oriented epitaxial wurtzite III-nitride layers grown on mismatched substrates have no
resolved shear stress on the natural basal and prismatic slip planes; however, strained III …

Demonstration of III-nitride red LEDs on Si substrates via strain-relaxed template by InGaN decomposition layer

V Rienzi, J Smith, N Lim, HM Chang, P Chan… - Crystals, 2022 - mdpi.com
A III-nitride red LED with an active region temperature of 835° C on a Si substrate utilizing a
strain-relaxed template (SRT) is demonstrated. The peak wavelength blueshifts from 670 nm …

MOVPE growth of GaN on Si–Substrates and strain

A Dadgar, P Veit, F Schulze, J Bläsing, A Krtschil… - Thin Solid Films, 2007 - Elsevier
GaN on Si offers a promising technology for the low-cost production of wide-bandgap
devices. Here, we present approaches towards the growth of GaN on technologically most …

Structural and morphological evolution of GaN grown by metalorganic chemical vapor deposition on SiC substrates using an AlN initial layer

B Moran, F Wu, AE Romanov, UK Mishra… - Journal of crystal …, 2004 - Elsevier
The morphological and structural evolution is presented for GaN grown by metalorganic
chemical vapor deposition on 25nm thick or 150nm thick AlN initial layers on (0001) 4H and …