Nanoionic memristive phenomena in metal oxides: the valence change mechanism
This review addresses resistive switching devices operating according to the bipolar
valence change mechanism (VCM), which has become a major trend in electronic materials …
valence change mechanism (VCM), which has become a major trend in electronic materials …
Physical electro-thermal model of resistive switching in bi-layered resistance-change memory
Tantalum-oxide-based bi-layered resistance-change memories (RRAMs) have recently
improved greatly with regard to their memory performances. The formation and rupture of …
improved greatly with regard to their memory performances. The formation and rupture of …
Nanoionic resistive switching memories: On the physical nature of the dynamic reset process
A Marchewka, B Roesgen, K Skaja… - Advanced Electronic …, 2016 - Wiley Online Library
Resistive switching memories based on the valence change mechanism have attracted
great attention due to their potential use in future nanoelectronics. The working principle …
great attention due to their potential use in future nanoelectronics. The working principle …
Phase-change and redox-based resistive switching memories
This paper addresses the two main resistive switching (RS) memory technologies: phase-
change memory (PCM) and redox-based resistive random access memory (ReRAM). It will …
change memory (PCM) and redox-based resistive random access memory (ReRAM). It will …
State dynamics and modeling of tantalum oxide memristors
A key requirement for using memristors in circuits is a predictive model for device behavior
that can be used in simulations and to guide designs. We analyze one of the most promising …
that can be used in simulations and to guide designs. We analyze one of the most promising …
Insight into physics‐based RRAM models–review
A Lekshmi Jagath, C Hock Leong… - The Journal of …, 2019 - Wiley Online Library
This article presents a review of physical, analytical, and compact models for oxide‐based
RRAM devices. An analysis of how the electrical, physical, and thermal parameters affect …
RRAM devices. An analysis of how the electrical, physical, and thermal parameters affect …
Designing zero-dimensional dimer-type all-inorganic perovskites for ultra-fast switching memory
Resistive switching memory that uses halide perovskites (HP) has been considered as next-
generation storage devices due to low operation voltage and high on/off ratio. However, the …
generation storage devices due to low operation voltage and high on/off ratio. However, the …
Direct observation of localized radial oxygen migration in functioning tantalum oxide memristors
Oxygen migration in tantalum oxide, a promising next-generation storage material, is studied
using in-operando x-ray absorption spectromicroscopy and is used to microphysically …
using in-operando x-ray absorption spectromicroscopy and is used to microphysically …
A double barrier memristive device
We present a quantum mechanical memristive Nb/Al/Al2O3/NbxOy/Au device which consists
of an ultra-thin memristive layer (NbxOy) sandwiched between an Al2O3 tunnel barrier and …
of an ultra-thin memristive layer (NbxOy) sandwiched between an Al2O3 tunnel barrier and …
Self‐Limited Switching in Ta2O5/TaOx Memristors Exhibiting Uniform Multilevel Changes in Resistance
To facilitate the development of memristive devices, it is essential to resolve the problem of
non‐uniformity in switching, which is caused by the random nature of the filamentary …
non‐uniformity in switching, which is caused by the random nature of the filamentary …