Electron trap** effects in SiC Schottky diodes: Review and comment

JR Nicholls - Microelectronics Reliability, 2021 - Elsevier
SiC devices exhibit a number of detrimental second order effects which are caused by
electrically active traps. The majority of studies into traps in SiC devices have been for SiC …

Schottky diode temperature sensor for pressure sensor

M Basov - Sensors and Actuators A: Physical, 2021 - Elsevier
The small silicon chip of Schottky diode (0.8× 0.8× 0.4 mm 3) with planar arrangement of
electrodes (chip PSD) as temperature sensor, which functions under the operating …

Extraction of electronic parameters of Schottky diode based on an organic semiconductor methyl-red

Z Ahmad, MH Sayyad - Physica E: Low-dimensional Systems and …, 2009 - Elsevier
The current–voltage (I–V) characteristics of Al/methyl-red/Ag surface-type structure were
investigated in air at room temperature. The conventional forward bias I–V method, Cheung …

The analysis of the series resistance and interface states of MIS Schottky diodes at high temperatures using I–V characteristics

A Tataroğlu, Ş Altındal - Journal of Alloys and Compounds, 2009 - Elsevier
The temperature dependence of the current–voltage (I–V) characteristics of Au/SiO2/n-Si
(MIS) Schottky diodes has been measured in the temperature range of 300–400K. Based on …

Temperature-dependent behavior of Ni/4H-nSiC Schottky contacts

ME Aydın, N Yıldırım, A Türüt - Journal of applied physics, 2007 - pubs.aip.org
The current-voltage (IV) characteristics of Ni/4 Hn SiC Schottky diodes have been measured
in the temperature range of 180–300 K with a temperature step of 20 K. An experimental …

Electrical characterization of Al/fluorescein sodium salt organic semiconductor/Au diode by current-voltage and capacitance-voltage methods

M Ilhan - Journal of materials and electronic devices, 2015 - dergi-fytronix.com
The organic Schottky diode of fluorescein sodium salt using aluminium and gold metals
were fabricated. Electronic and interface state properties of the Al/p-FSS Schottky diode …

Rejuvenation of degraded Zener diodes with the electron wind force

MH Rahman, NS Al-Mamun, N Glavin… - Applied Physics …, 2024 - iopscience.iop.org
In this study, we explore the rejuvenation of a Zener diode degraded by high electrical
stress, leading to a leftward shift, and broadening of the Zener breakdown voltage knee …

Comparative study of the electrical properties of Au/n-Si (MS) and Au/Si3N4/n-Si (MIS) Schottky diodes

A Tataroğlu - Chinese Physics B, 2013 - iopscience.iop.org
In this paper, the electrical parameters of Au/n-Si (MS) and Au/Si 3 N 4/n-Si (MIS) Schottky
diodes are obtained from the forward bias current—voltage (I—V) and capacitance—voltage …

Temperature-Dependent Electrical Characteristics of Au/Si3N4/4H n-SiC MIS Diode

F Yigiterol, HH Güllü, Ö Bayraklı, DE Yıldız - Journal of Electronic Materials, 2018 - Springer
Electrical characteristics of the Au/Si 3 N 4/4H n-SiC metal–insulator-semiconductor (MIS)
diode were investigated under the temperature, TT, interval of 160–400 K using current …

Realization of diode structures on paper: An example of papertronics

R Dey, S Hussain, AK Pal - Current Applied Physics, 2024 - Elsevier
A possibility of fabricating paper/Ag/CdTe/Au Schottky and paper/Ag/CdTe/CdS/In pn
junction diode structures has been demonstrated here. Ag (∼ 5 μm), CdTe (∼ 50 μm), CdS …