Hybrid transient liquid phase sintering bonding of Sn-3.0 Ag-0.5 Cu solder with added Cu and Ni for CuNi bonding

KD Min, CJ Lee, BU Hwang, JH Kim, JH Jang… - Applied Surface …, 2021 - Elsevier
A novel approach to copper-nickel bonding was investigated by hybrid transient liquid
phase sintering (TLPS) method. Hybrid bonding material containing copper, nickel, and Sn …

Facile synthesis of nickel–copper hollow spheres as efficient bifunctional electrocatalysts for overall water splitting

L Lin, M Chen, L Wu - Materials Chemistry Frontiers, 2020 - pubs.rsc.org
Sustainable energy conversion has motivated researchers to design and develop novel
efficient bifunctional electrocatalysts for water splitting. In this work, we report the facile …

Study of intermetallic growth and kinetics in fine-pitch lead-free solder bumps for next-generation flip-chip assemblies

Y Tian, J Chow, X Liu, YP Wu, SK Sitaraman - Journal of electronic …, 2013 - Springer
With continued advances in microelectronics, it is anticipated that next-generation
microelectronic assemblies will require a reduction of the flip-chip solder bump pitch to 100 …

The influence of current direction on the Cu-Ni cross-interaction in Cu/Sn/Ni diffusion couples

WH Wu, HL Chung, CN Chen, CE Ho - Journal of electronic materials, 2009 - Springer
The influence of current direction on the Cu-Ni cross-interaction in the Cu/Sn/Ni joint
configuration was investigated in this study. During current stressing, an electric current …

Effects of joining sequence on the interfacial reactions and substrate dissolution behaviors in Ni/solder/Cu joints

CS Liu, CE Ho, CS Peng, CR Kao - Journal of electronic materials, 2011 - Springer
The effects of the joining sequence on the interfacial reactions and substrate dissolution
behaviors in Ni/solder/Cu joints were studied by using 500-μ m (diameter) Sn-3.5 Ag solder …

Different diffusion behavior of Cu and Ni undergoing liquid–solid electromigration

ML Huang, ZJ Zhang, HT Ma, LD Chen - Journal of Materials Science & …, 2014 - Elsevier
The diffusion behavior of Cu and Ni atoms undergoing liquid–solid electromigration (LS EM)
was investigated using Cu/Sn/Ni interconnects under a current density of 5.0× 10 3 A/cm 2 at …

Effects of Ni3Sn4 and (Cu, Ni) 6Sn5 intermetallic layers on cross-interaction between Pd and Ni in solder joints

YH Baek, BM Chung, YS Choi, J Choi… - Journal of alloys and …, 2013 - Elsevier
We examined the effects of layers of intermetallic compound (IMC) Ni 3 Sn 4 and (Cu, Ni) 6
Sn 5 formed at the solder/Ni interface, on the cross-interactions between Pd and Ni during …

Reaction within Ni/Sn/Cu microjoints for chip-stacking applications

YW Wang, WL Shih, HT Hung, CR Kao - Journal of Electronic Materials, 2019 - Springer
Abstract The reaction within Ni/Sn/Cu microjoints has been investigated with a 10 μ m initial
thickness of Sn so that Sn was quickly consumed in the early stage of the reaction …

Mechanical property and fracture behavior characterizations of 96.5 Sn–3.0 Ag–0.5 Cu solder joints

SY Chang, YC Huang, YM Lin - Journal of Alloys and Compounds, 2010 - Elsevier
In this study, 96.5 Sn–3.0 Ag–0.5 Cu solder balls were joined to Au/Ni–P/Cu pads by a
thermal reflow process. The interface reactions, solderablity and mechanical reliability of the …

Effect of reflow temperature and solder size on Cu-Ni cross-interaction in the Cu/Sn/Ni micro solder joints

X Gao, ZJ Zhang, H Wei, X Zhou, Q Shi… - Microelectronics …, 2024 - emerald.com
Purpose Solder bumps for chip interconnections are downsizing from current approximately
100 µm to the expected 1 µm in future. As a result, the Cu-Ni cross-interaction in …