Turnitin
降AI改写
早检测系统
早降重系统
Turnitin-UK版
万方检测-期刊版
维普编辑部版
Grammarly检测
Paperpass检测
checkpass检测
PaperYY检测
Hybrid transient liquid phase sintering bonding of Sn-3.0 Ag-0.5 Cu solder with added Cu and Ni for CuNi bonding
A novel approach to copper-nickel bonding was investigated by hybrid transient liquid
phase sintering (TLPS) method. Hybrid bonding material containing copper, nickel, and Sn …
phase sintering (TLPS) method. Hybrid bonding material containing copper, nickel, and Sn …
Facile synthesis of nickel–copper hollow spheres as efficient bifunctional electrocatalysts for overall water splitting
L Lin, M Chen, L Wu - Materials Chemistry Frontiers, 2020 - pubs.rsc.org
Sustainable energy conversion has motivated researchers to design and develop novel
efficient bifunctional electrocatalysts for water splitting. In this work, we report the facile …
efficient bifunctional electrocatalysts for water splitting. In this work, we report the facile …
Study of intermetallic growth and kinetics in fine-pitch lead-free solder bumps for next-generation flip-chip assemblies
With continued advances in microelectronics, it is anticipated that next-generation
microelectronic assemblies will require a reduction of the flip-chip solder bump pitch to 100 …
microelectronic assemblies will require a reduction of the flip-chip solder bump pitch to 100 …
The influence of current direction on the Cu-Ni cross-interaction in Cu/Sn/Ni diffusion couples
WH Wu, HL Chung, CN Chen, CE Ho - Journal of electronic materials, 2009 - Springer
The influence of current direction on the Cu-Ni cross-interaction in the Cu/Sn/Ni joint
configuration was investigated in this study. During current stressing, an electric current …
configuration was investigated in this study. During current stressing, an electric current …
Effects of joining sequence on the interfacial reactions and substrate dissolution behaviors in Ni/solder/Cu joints
The effects of the joining sequence on the interfacial reactions and substrate dissolution
behaviors in Ni/solder/Cu joints were studied by using 500-μ m (diameter) Sn-3.5 Ag solder …
behaviors in Ni/solder/Cu joints were studied by using 500-μ m (diameter) Sn-3.5 Ag solder …
Different diffusion behavior of Cu and Ni undergoing liquid–solid electromigration
ML Huang, ZJ Zhang, HT Ma, LD Chen - Journal of Materials Science & …, 2014 - Elsevier
The diffusion behavior of Cu and Ni atoms undergoing liquid–solid electromigration (LS EM)
was investigated using Cu/Sn/Ni interconnects under a current density of 5.0× 10 3 A/cm 2 at …
was investigated using Cu/Sn/Ni interconnects under a current density of 5.0× 10 3 A/cm 2 at …
Effects of Ni3Sn4 and (Cu, Ni) 6Sn5 intermetallic layers on cross-interaction between Pd and Ni in solder joints
YH Baek, BM Chung, YS Choi, J Choi… - Journal of alloys and …, 2013 - Elsevier
We examined the effects of layers of intermetallic compound (IMC) Ni 3 Sn 4 and (Cu, Ni) 6
Sn 5 formed at the solder/Ni interface, on the cross-interactions between Pd and Ni during …
Sn 5 formed at the solder/Ni interface, on the cross-interactions between Pd and Ni during …
Reaction within Ni/Sn/Cu microjoints for chip-stacking applications
Abstract The reaction within Ni/Sn/Cu microjoints has been investigated with a 10 μ m initial
thickness of Sn so that Sn was quickly consumed in the early stage of the reaction …
thickness of Sn so that Sn was quickly consumed in the early stage of the reaction …
Mechanical property and fracture behavior characterizations of 96.5 Sn–3.0 Ag–0.5 Cu solder joints
SY Chang, YC Huang, YM Lin - Journal of Alloys and Compounds, 2010 - Elsevier
In this study, 96.5 Sn–3.0 Ag–0.5 Cu solder balls were joined to Au/Ni–P/Cu pads by a
thermal reflow process. The interface reactions, solderablity and mechanical reliability of the …
thermal reflow process. The interface reactions, solderablity and mechanical reliability of the …
Effect of reflow temperature and solder size on Cu-Ni cross-interaction in the Cu/Sn/Ni micro solder joints
X Gao, ZJ Zhang, H Wei, X Zhou, Q Shi… - Microelectronics …, 2024 - emerald.com
Purpose Solder bumps for chip interconnections are downsizing from current approximately
100 µm to the expected 1 µm in future. As a result, the Cu-Ni cross-interaction in …
100 µm to the expected 1 µm in future. As a result, the Cu-Ni cross-interaction in …