Solution-processed metal-oxide thin-film transistors (TFTs) with different metal compositions
are investigated for ex situ and in situ radiation hardness experiments against ionizing …

This article proposes two quadruple node upset (QNU) recoverable latches, namely QNU-
recoverable and high-impedance-state (HIS)-insensitive latch (QRHIL) and QRHIL-LC (low …

As semiconductor technologies scale down, radiative-particle-induced soft errors and static
power consumption are becoming major concerns for digital circuits. Magnetic-tunnel …

After a thorough investigation, the Editor in Chief has concluded that this article must be
retracted due to serious errors, such as including 24 inappropriate references, a duplication …

This work presents a single event double node upset (SEDNU) self-healing (DNUSH) latch
to meet the high-robustness requirement of the applications used in a harsh radiation …

As the feature size of the nanoscale CMOS keeps scaling down, the charge sharing effect is
becoming more and more prominent, and the occurrence possibility of the triple-node upset …

Present investigation, effect of different forms of rectangular fins on melting performance of a
vertical enclosure filled by with phase change material (PCM) was examined. Three …

Cloud data centers do not completely use their resources, resulting in resource
underutilization. Cloud computing companies primarily leverage virtualization technologies …

With continuous advancement in technology, latches have become highly susceptible to
radiation induced soft-errors such as multi-node-upsets (MNU). To effectively resilient the …

As CMOS technology scaling pushes towards the reduction of the length of transistors,
electronic circuits face numerous reliability issues, and in particular nodes of D-latches at …