Shock impact reliability and failure analysis of a three-axis MEMS gyroscope

J Li, M Broas, J Makkonen, TT Mattila… - Journal of …, 2013 - ieeexplore.ieee.org
This paper presents the reliability assessment of a three-axis microelectromechanical
systems (MEMS) gyroscope subjected to various shock loading conditions. The reliability …

Reliability assessment of a MEMS microphone under mixed flowing gas environment and shock impact loading

J Li, M Broas, J Raami, TT Mattila… - Microelectronics …, 2014 - Elsevier
In this work the reliability of a Micro-Electro-Mechanical Systems (MEMS) microphone is
studied through two accelerated life tests, mixed flowing gas (MFG) testing and shock impact …

Evaluation of the drop response of handheld electronic products

TT Mattila, L Vajavaara, J Hokka, E Hussa… - Microelectronics …, 2014 - Elsevier
The aim of the product level drop response evaluation presented in this paper is to provide
goals and guidelines for the development of a board-level drop test methodology that would …

Stress analysis of CMOS-MEMS microphone under shock loading by Taguchi method

CL Lu, PR Ni, MK Yeh - Microelectronics Reliability, 2018 - Elsevier
The stress distribution and failure of CMOS-MEMS microphone under shock loading was
investigated by finite element method in this study. The results show that corners of spring …

A comprehensive review of drop impact modeling on portable electronic devices

YH Yau, SN Hua - 2011 - asmedigitalcollection.asme.org
This article is dedicated to the review of publications on drop impact analysis performed on
consumer electronic devices such as cellular phones and two-way radios in the past …

Reliability assessment of a MEMS microphone under shock impact loading

J Li, J Makkonen, M Broas, J Hokka… - … and Multi-Physics …, 2013 - ieeexplore.ieee.org
In this paper the shock impact reliability of a MEMS microphone is studied through
experiments and finite element simulations. The maximum acceleration tolerance of the …

A novel impact test system for more efficient reliability testing

J Hokka, TT Mattila, J Li, J Teeri, JK Kivilahti - Microelectronics Reliability, 2010 - Elsevier
Portable electronic products such as mobile phones experience various loadings in their
use environments but accidental drops are encountered most frequently. Over the past few …

Testing and multi-scale modeling of drop and impact loading of complex MEMS microphone assemblies

J Meng, T Mattila, A Dasgupta… - … and Multi-Physics …, 2012 - ieeexplore.ieee.org
Failure under dynamic mechanical stresses caused by impact and drop loading is a critical
concern for reliability of surface mount components in portable electronic products. This …

Replacement of the drop test with the vibration test—The effect of test temperature on reliability

TT Mattila, L Suotula, JK Kivilahti - 2008 58th Electronic …, 2008 - ieeexplore.ieee.org
Due to the more extensive testing of new portable products the employment of efficient
testing methods has become ever more important. The replacement of the commonly …

[PDF][PDF] Thermomechanical and Mechanical Characterization of a 3-axial MEMS Gyroscope

H Hyvönen - Aalto University, Helsinky, Finland, 2011 - aaltodoc.aalto.fi
The functionality of the rotation device was tested with rotating one gyroscope board at room
temperature. Respective averages and standard deviations of angular velocities were …