This paper discusses the principles and experimental status of gas cluster ion beam (GCIB)
processing as a promising surface modification technique for practical industrial …

Energetic ion bombardment of solid targets can lead to the production of atomic recoils and
defects within the solid and the ejection or sputtering of atoms from the surface with the …

We derive a stochastic nonlinear continuum equation to describe the morphological
evolution of amorphous surfaces eroded by ion bombardment. Starting from Sigmund's …

When collimated beams of low energy ions are used to bombard materials, the surface often
develops a periodic pattern or “ripple” structure. Different types of patterns are observed to …

We demonstrate depth profiling of polymer materials by using large argon (Ar) cluster ion
beams. In general, depth profiling with secondary ion mass spectrometry (SIMS) presents …

The book presents an overview on important aspects of ion irradiation of surfaces,
emphasizing low impact energies. Specifically, ion penetration and implantation into solids …

This article considers the fundamentals of what happens in a solid when it is impacted by a
medium-energy gallium ion. The study of the ion/sample interaction at the nanometer scale …

Secondary ion mass spectrometry (SIMS) measurement of sulfur isotope ratios is a
potentially powerful technique for in situ studies in many areas of Earth and planetary …

An overview is given of the possibilities and limitations of secondary ion mass spectrometry
as an analytical tool in the investigation of near-perfect, ie almost atomically sharp, dopant …

The formation of ripples on Si (100) by O+ 2 sputtering at an angle of incidence of 40° and
energies from 1 to 9 keV has been studied using secondary ion mass spectrometry and …