In this article of generalized view, a comparison of the long‐range order crystalline
perfection of crystals is made with respect to their planes grown by the unidirectional growth …

This article describes complete characterization of the polygonal dislocation half-loops
(PDHLs) introduced by scratching and subsequent bending of an Si (111) crystal. The study …

The spatial arrangement of single linear defects in a Si single crystal (input surface {111})
has been investigated by X-ray topo-tomography using laboratory X-ray sources. The …

The spatial distribution of linear defects in cuboctahedral single crystals of synthetic
diamonds, grown under laboratory conditions by the high-pressure high-temperature …

A successive approach to the solution of the inverse problem of the X-ray diffraction
tomography (XRDT) is proposed. It is based on the semi-kinematical solution of the …

In this paper, which is dedicated to the 100th anniversary of the discovery of X-ray diffraction
(which occurs in 2012), the role and significance of X-ray diffraction topography for materials …

Oblique X-ray diffraction images of individual dislocations in the symmetric Laue geometry
from a plane-parallel silicon plate have been calculated based on the Takagi-Taupin …

Technological advancements and increasing demands have led to significant innovations in
the field of materials science. Nonwoven materials, a crucial subfield of the textile industry …

The influence of a temperature gradient on anomalous absorption (Bormann effect) in quartz
crystals observed in Bragg diffraction in Laue geometry in dynamic diffraction of X-rays for …

A successive approach to the solution of the inverse problem of diffraction X-ray topo-
tomography is proposed. It is based on the semikinematic solution to the Takagi–Taupin …