System and software for data collection and process control in semiconductor manufacturing and method thereof

Y Shi, DA Richardson, RC Brown, DC Likes… - US Patent …, 2005 - Google Patents
In its various embodiments, the method collects data from process and metrology tools in a
Semiconductor manufac turing environment, generates Statistics from that data, detects tool …

Systems and methods for making prediction on energy consumption of energy-consuming systems or sites

M Amaratunga, S Bagepalli, LA DeRose… - US Patent App. 09 …, 2003 - Google Patents
An energy-consumption predicting System remotely mea Sures amounts of energy
consumed by energy-consuming Systems or an energy-consuming site; monitors and com …

Method and apparatus for computing a sum of packed data elements using SIMD multiply circuitry

MA Abdallah, V Pentkovski - US Patent 6,377,970, 2002 - Google Patents
US6377970B1 - Method and apparatus for computing a sum of packed data elements using
SIMD multiply circuitry - Google Patents US6377970B1 - Method and apparatus for computing a …

Method and apparatus for performing multiply-add operations on packed data

E Debes, WW Macy, JJ Tyler, AD Peleg… - US Patent …, 2008 - Google Patents
(57) ABSTRACT A method and apparatus for including in a processor instruc tions for
performing multiply–add operations on packed data. In one embodiment, a processor is …

Method and apparatus for performing multiply-add operations on packed byte data

E Debes, WW Macy, JJ Tyler, J Coke, F Binns… - US Patent …, 2008 - Google Patents
US7430578B2 - Method and apparatus for performing multiply-add operations on packed byte
data - Google Patents US7430578B2 - Method and apparatus for performing multiply-add …

System, method, and medium for monitoring performance of an advanced process control system

AT Schwarm - US Patent 7,356,377, 2008 - Google Patents
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Multivariate statistical process analysis systems and methods for the production of melt polycarbonate

RA Potyrailo - US Patent 6,549,864, 2003 - Google Patents
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Scaling-up process characterization

J Sall - Quality Engineering, 2018 - Taylor & Francis
Most of the literature on statistical process monitoring (SPM) concerns a single process or a
few of them. Yet, in a modern manufacturing plant there may be thousands of process …

Method and apparatus for computing a packed absolute differences with plurality of sign bits using SIMD add circuitry

MA Abdallah, V Pentkovski - US Patent 6,243,803, 2001 - Google Patents
US6243803B1 - Method and apparatus for computing a packed absolute differences with
plurality of sign bits using SIMD add circuitry - Google Patents US6243803B1 - Method and …

System and software for database structure in semiconductor manufacturing and method thereof

Y Shi, RB Patty, RC Brown - US Patent 6,839,713, 2005 - Google Patents
(54) SYSTEM AND SOFTWARE FOR DATABASE 5.991, 699 A 11/1999 Kulkarni et al.
STRUCTURE IN SEMCONDUCTOR 5,995,912 A 11/1999 DeWolf et al. MANUFACTURING …