Turnitin
降AI改写
早检测系统
早降重系统
Turnitin-UK版
万方检测-期刊版
维普编辑部版
Grammarly检测
Paperpass检测
checkpass检测
PaperYY检测
Special session: Physical attacks through the chip backside: Threats, challenges, and opportunities
This paper reviews the evolution of a powerful class of physical attacks against integrated
circuits (ICs), developed initially for performing failure analysis (FA) from the IC backside …
circuits (ICs), developed initially for performing failure analysis (FA) from the IC backside …