During the past 20 years, the manipulation of atoms and molecules at surfaces has allowed
the construction and characterization of model systems that could, potentially, act as building …

Microscopists have always pursued the development of an instrument that combines
topography and materials properties analyses at the highest resolution. The measurement of …

Scanning probe microscopy is a versatile and powerful method that uses sharp tips to
image, measure and manipulate matter at surfaces with atomic resolution,. At cryogenic …

Nanotechnology: An Introduction, Second Edition, is ideal for the newcomer to
nanotechnology, someone who also brings a strong background in one of the traditional …

One of the outstanding advancements in electronic‐structure density‐functional methods is
the Sankey–Niklewski (SN) approach [Sankey and Niklewski, Phys. Rev. B 40, 3979 (1989)]; …

Identification of energy-dissipation processes at the nanoscale is demonstrated by using
amplitude-modulation atomic force microscopy. The variation of the energy dissipated on a …

The ability to incorporate individual atoms in a surface following predetermined
arrangements may bring future atom-based technological enterprises closer to reality. Here …

The current status and future prospects of non‐contact atomic force microscopy (nc‐AFM)
and Kelvin probe force microscopy (KPFM) for studying insulating surfaces and thin …

We explore different tip functionalizations for atomic force microscopy (AFM), scanning
tunneling microscopy (STM), and Kelvin probe force microscopy (KPFM) of organic …

Atomic force microscopy (AFM) has been widely used in materials science and chemistry
research since it was invented in the 1980s. It is a relatively new tool for geosciences and is …