Materials characterization by synchrotron x-ray microprobes and nanoprobes

L Mino, E Borfecchia, J Segura-Ruiz, C Giannini… - Reviews of Modern …, 2018 - APS
In recent years synchrotron x-ray microprobes and nanoprobes have emerged as key
characterization tools with a remarkable impact for different scientific fields including solid …

PETRA IV: the ultralow-emittance source project at DESY

CG Schroer, I Agapov, W Brefeld… - Synchrotron …, 2018 - journals.iucr.org
The PETRA IV project aims at upgrading the present synchrotron radiation source PETRA III
at DESY into an ultralow-emittance source. Being diffraction limited up to X-rays of about 10 …

New opportunities at the Materials Science Beamline at ESRF to exploit high energy nano-focus X-ray beams

J Wright, C Giacobbe, M Majkut - Current Opinion in Solid State and …, 2020 - Elsevier
A new end station for high energy (30–70 keV) X-ray diffraction experiments with nano-focus
(150–500 nm) beam sizes has been installed at beamline ID11 at the ESRF. We review …

X-ray focusing with efficient high-NA multilayer Laue lenses

S Bajt, M Prasciolu, H Fleckenstein… - Light: Science & …, 2018 - nature.com
Multilayer Laue lenses are volume diffraction elements for the efficient focusing of X-rays.
With a new manufacturing technique that we introduced, it is possible to fabricate lenses of …

Perfect X-ray focusing via fitting corrective glasses to aberrated optics

F Seiboth, A Schropp, M Scholz, F Wittwer… - Nature …, 2017 - nature.com
Due to their short wavelength, X-rays can in principle be focused down to a few nanometres
and below. At the same time, it is this short wavelength that puts stringent requirements on X …

A deep convolutional neural network for real-time full profile analysis of big powder diffraction data

H Dong, KT Butler, D Matras, SWT Price… - NPJ Computational …, 2021 - nature.com
Abstract We present Parameter Quantification Network (PQ-Net), a regression deep
convolutional neural network providing quantitative analysis of powder X-ray diffraction …

Interlaced zone plate optics for hard X-ray imaging in the 10 nm range

I Mohacsi, I Vartiainen, B Rösner, M Guizar-Sicairos… - Scientific Reports, 2017 - nature.com
Multi-keV X-ray microscopy has been particularly successful in bridging the resolution gap
between optical and electron microscopy. However, resolutions below 20 nm are still …

Design and performance of an X-ray scanning microscope at the Hard X-ray Nanoprobe beamline of NSLS-II

E Nazaretski, H Yan, K Lauer, N Bouet… - Synchrotron …, 2017 - journals.iucr.org
A hard X-ray scanning microscope installed at the Hard X-ray Nanoprobe beamline of the
National Synchrotron Light Source II has been designed, constructed and commissioned …

Multimodal hard x-ray imaging with resolution approaching 10 nm for studies in material science

H Yan, N Bouet, J Zhou, X Huang, E Nazaretski… - Nano …, 2018 - iopscience.iop.org
We report multimodal scanning hard x-ray imaging with spatial resolution approaching 10
nm and its application to contemporary studies in the field of material science. The high …

The ESRF dark-field x-ray microscope at ID06

M Kutsal, P Bernard, G Berruyer, PK Cook… - IOP conference …, 2019 - iopscience.iop.org
We present an instrument for dark-field x-ray microscopy installed on beamline ID06 of the
ESRF—the first of its kind. Dark-field x-ray microscopy uses full field illumination of the …