The Atomic Force Microscope (AFM) is one of the most versatile tools in nanotechnology.
For control engineers this instrument is particularly interesting, since its ability to image the …

Force microscopy enables a variety of approaches to manipulate and/or modify surfaces.
Few of those methods have evolved into advanced probe-based lithographies. Oxidation …

In this paper, the resonant frequency and sensitivity of atomic force microscope (AFM)
microcantilevers are studied using the modified couple stress theory. The classical …

We describe a simple method for fabricating superhydrophobic high temperature vulcanized
(HTV) silicone rubber surfaces by direct replication using a compression molding system …

Abstract In this Progress Report, outstanding scientific applications of scanning probe
microscopy (SPM) in the field of materials science and the latest technique developments …

A new technique for producing nanometre scale patterns on thin layers (< 30 nm thick) of
PMMA on silicon is described. The method consists of inducing the local modification of the …

Molecular dynamics (MD) simulation and an experimental method were carried out to study
the effects of applied load, hold time, and temperature on nanoscratching and …

Use of the microcantilever in an atomic force microscope (AFM) that has been enhanced
with a diamond abrasive grain has emerged as a powerful nanolithography technique …

The tribonanolithography (TNL) of silicon substrate in aqueous solution based on the use of
atomic force microscopy is demonstrated. A specially designed cantilever with a diamond …

Scanning probe lithography (SPL) techniques are mainly based on electrical, mechanical,
and thermal interactions between a tip and substrates. By comparison, the electrical field …