The rapid development of chip manufacturing technology has increased the demand for
precise characterization techniques. The characterization technique of the physical field on …

A systematic and quantitative comparison of electrical detection systems in scanning
microwave microscopy is reported. Scanning microwave microscopy (SMM) is capable of …

Here, we investigate the measurement capability of a near-field scanning microwave
microscope (SMM) using an atomic force microscope with several types of matching circuits …

A broadband S-parameter measurement system for extreme impedance measurements is
proposed and analyzed in terms of its accuracy. Measurement speed and system resolution …

This paper analyzes and accurately models the complex noise behavior of vector network
analyzers (VNAs) when measuring large-mismatch devices and subsequently shows how …

Nano-scale devices and high-power transistors present extreme impedances, which are far
removed from the 50-Ω reference impedance of conventional test equipment, resulting in a …

The addition of RF interferometers to vector network analyzer (VNA) test benches has
allowed for realization of low-noise high-frequency measurements of extreme impedance …

In the European project PlanarCal a major effort has been undertaken to characterise
components and devices for eventual use in high-speed and microwave applications (eg …

In this contribution we present a custom test-bench capable of delivering multi-path mm-
wave signals with amplitude and phase control to an on-wafer environment. The setup …

As instantaneous bandwidths and overall frequency ranges continue to increase in wireless
communications, measurement requirements, even at the device and subsystem level, are …