Silicon nanocrystals: size matters

J Heitmann, F Müller, M Zacharias… - Advanced …, 2005 - Wiley Online Library
This paper reviews new approaches to size‐controlled silicon‐nanocrystal synthesis. These
approaches allow narrowing of the size distribution of the nanocrystals compared with those …

Ultralarge capacitance–voltage hysteresis and charge retention characteristics in metal oxide semiconductor structure containing nanocrystals deposited by ion-beam …

Y Kim, KH Park, TH Chung, HJ Bark, JY Yi… - Applied Physics …, 2001 - pubs.aip.org
Amorphous silicon films are deposited by ion-beam-assisted electron beam deposition and
subsequently oxidized by a rapid thermal oxidation process. The oxidized film contains a …

The present status of Si/SiO2 superlattice research into optoelectronic applications

T Zheng, Z Li - Superlattices and Microstructures, 2005 - Elsevier
Due to the potential applications in optoelectronic areas, Si/SiO2 superlattices have been
focused on extensively in the last few years. The work spans a wide range from theory to …

Resonant tunneling in partially disordered silicon nanostructures

L Tsybeskov, GF Grom, R Krishnan, L Montès… - Europhysics …, 2001 - iopscience.iop.org
Low-temperature vertical carrier transport in layered structures comprised of Si nanocrystals
separated in the growth direction by angstrom-thick SiO 2 layers exhibits entirely …

Structure and luminescence of silicon nanocrystals embedded in SiO2

GG Ross, D Barba, F Martin - International journal of …, 2008 - inderscienceonline.com
According to the International Technology Roadmap for Semiconductors, there is no
manufacturable solution to address the increasing interconnection lengths in microelectronic …

Charge retention characteristics in a metal–insulator–semiconductor capacitor containing Ge nanocrystals

Y Kim, HJ Cheong, KH Park, TH Chung… - Semiconductor …, 2002 - iopscience.iop.org
We investigate the charge retention characteristics in a metal–insulator–semiconductor
capacitor containing Ge nanocrystals (∼ 3 nm in diameter) using capacitance–voltage …

Controlled nucleation of silicon nanocrystals on a periodic template

CC Striemer, R Krishnan, PM Fauchet, L Tsybeskov… - Nano …, 2001 - ACS Publications
This paper presents a successful unification of standard lithographic approaches (top down),
anisotropic etching of atomically smooth surfaces, and controlled crystallization of silicon …

Charge-storage effects in a metal-insulator-semi-conductor structure containing germanium nano-crystals formed by rapid thermal annealing of an electron-beam …

CL Heng, WW Tjiu, TG Finstad - Applied Physics A, 2004 - Springer
Charge-storage effects in a metal-insulator-semi-conductor device containing germanium
(Ge) nano-crystals were investigated. The Ge nano-crystals were formed by rapid thermal …

Charge retention effect in metal–oxide–semiconductor structure containing Si nanocrystals prepared by ion-beam-assisted electron beam deposition

Y Kim, KH Park, WC Choi, TH Chung, HJ Bark… - Materials Science and …, 2001 - Elsevier
An amorphous Si layer prepared by ion-beam-assisted electron beam deposition (IBAED)
method is oxidized by a rapid thermal oxidation technique. We observe a nanocrystal band …

Investigation of nc-Si inclusions in multilayer a-Si: H films obtained using the layer by layer technique

AS Gudovskikh, JP Kleider, VP Afanasjev… - Journal of non …, 2004 - Elsevier
The development of the nanocrystalline silicon inclusions in homogeneous and multilayered
a-Si: H films was investigated by transmission electron microscopy (TEM). The …