This book is a comprehensive guide to new DFT methods that will show the readers how to
design a testable and quality product, drive down test cost, improve product quality and …

This paper presents a novel test-data volume-compression methodology called the
embedded deterministic test (EDT), which reduces manufacturing test cost by providing one …

This book provides broad and comprehensive coverage of the entire EDA flow. EDA/VLSI
practitioners and researchers in need of fluency in an" adjacent" field will find this an …

Modern electronics testing has a legacy of more than 40 years. The introduction of new
technologies, especially nanometer technologies with 90nm or smaller geometry, has …

This paper introduces embedded deterministic test (EDT) technology, which reduces
manufacturing test cost by providing one to two orders of magnitude reduction in scan test …

We present a test resource partitioning (TRP) technique that simultaneously reduces test
data volume, test application time, and scan power. The proposed approach is based on the …

Databases are at the core of successful businesses. Due to the voluminous stores of
personal data being held by companies today, preserving privacy has become a crucial …

This paper presents a new test-data compression technique that uses exactly nine
codewords. Our technique aims at precomputed data of intellectual property cores in system …

Extending OPMISR beyond 10/spl times/ scan test efficiency Page 1 65 0740-7475/02/$17.00 ©
2002 IEEE September–October 2002 SCAN-BASED LOGIC TESTING using auto- matic …

This article mixes two encoding techniques to reduce test data volume, test pattern delivery
time, and power dissipation in scan test applications. This is achieved by using run-length …