Soft errors are the primary concern in space and terrestrial integrated circuit applications.
When a charged particle from space collides with a scaled memory circuit, a transient pulse …

Various charged particles in space, including α-particles, neutrons, heavy ions, and photons,
create stability and reliability concerns in memory circuits. Furthermore, these particles …

Many charged particles in space, including α-particles, neutrons, heavy ions, electrons, and
photons, wreak havoc on the stability and reliability of memory circuits. In addition, these …

The static random-access memory (SRAM) cells used in the high radiation environment of
aerospace have become highly vulnerable to single-event effects (SEE). Therefore, a 12T …

Various charged particles in space, including alpha particles, neutrons, heavy ions, and
photons, pose reliability and stability concerns for memory circuits. These particles also …

Space radiation particles causes malfunction in electric circuits. It is especially susceptible to
memory-sensitive storage devices. When it affects data stored in the memory circuit, it …

The impact of high-energy particles in space like cosmic rays and alpha particles flips the
stored data in an SRAM cell. This paper proposes a highly reliable soft error immune with …

Various charged particles in space, including alpha particles, neutrons, heavy ions, and
photons, pose reliability and stability concerns for memory circuits. These particles also …