Influence of plasmon excitations on atomic-resolution quantitative 4D scanning transmission electron microscopy
Scanning transmission electron microscopy (STEM) allows to gain quantitative information
on the atomic-scale structure and composition of materials, satisfying one of todays major …
on the atomic-scale structure and composition of materials, satisfying one of todays major …
Angle-resolved STEM using an iris aperture: Scattering contributions and sources of error for the quantitative analysis in Si
The angle-resolved electron scattering is investigated in scanning-transmission electron
microscopy (STEM) using a motorised iris aperture placed above a conventional annular …
microscopy (STEM) using a motorised iris aperture placed above a conventional annular …
Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous thickness and composition determination
In this paper, a methodology is presented to count the number of atoms in heterogeneous
nanoparticles based on the combination of multiple annular dark field scanning transmission …
nanoparticles based on the combination of multiple annular dark field scanning transmission …
Quantitative composition determination by ADF-STEM at a low-angular regime: A combination of EFSTEM and 4DSTEM
High-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) is
a valuable method for composition determination of nanomaterials. However, light elements …
a valuable method for composition determination of nanomaterials. However, light elements …
Optimization of imaging conditions for composition determination by annular dark field STEM
Quantitative scanning transmission electron microscopy (STEM) allows composition
determination for nanomaterials at an atomic scale. To improve the accuracy of the results …
determination for nanomaterials at an atomic scale. To improve the accuracy of the results …
Composition determination for quaternary III–V semiconductors by aberration-corrected STEM
Quantitative scanning transmission electron microscopy (STEM) is a powerful tool for the
characterization of nano-materials. Absolute composition determination for ternary III–V …
characterization of nano-materials. Absolute composition determination for ternary III–V …
Quantitative Scanning Transmission Electron Microscopy for III-V Semiconductor Heterostructures Utilizing Multi-Slice Image Simulations
P Kükelhan - 2019 - archiv.ub.uni-marburg.de
Quantitative STEM can satisfy the demand of modern semiconductor device development for
atomically resolved structural information. Thereby, quantitative evaluations can be based …
atomically resolved structural information. Thereby, quantitative evaluations can be based …