Provided is a method for testing a plurality of transistors of a semiconductor device. The
method includes forming a plurality of elements or a plurality of logic using a Front End Of …

(57) ABSTRACT A semiconductor device includes a plurality of standard cells. The plurality
of standard cells include a first group of standard cells arranged in a first row extending in a …

Techniques facilitating three-dimensional monolithic verti cal field effect transistor logic
gates are provided. A logic device can comprise a first vertical transport field effect transistor …

According to example embodiments, a semiconductor device and a method for
manufacturing the same are pro vided, the semiconductor device includes a Substrate …

A computer implemented system and method is provided for generating a layout of the cell
defining a circuit component, the layout providing a layout pattern for a target process …

A method of designing a layout of a semiconductor device includes receiving information on
a size of a target chip and a unit placement width for forming a gate line through a self-align …

A method of designing a semiconductor device includes preparing a standard cell layout
including a layout out a preliminary pin pattern in at least one interconnection layout …

The present invention provides a system and computer implemented method for generating
a layout of a cell defining a circuit component, the layout providing a layout pattern for a …

(57) ABSTRACT A semiconductor device includes a plurality of standard cells. The plurality
of standard cells include a first group of standard cells arranged in a first row extending in a …

324/762. 01 6, 532, 579 B2 3/2003 Sato et al. 6, 662, 350 B2 12/2003 Fried et al. 7, 102, 413
B2. 9/2006 Kuroda 7, 547, 597 B2. 6/2009 Kau et al. 7, 685, 540 B1 3/2010 Madden et al. 7 …