[BOOK][B] Strain effect in semiconductors: theory and device applications

Y Sun, SE Thompson, T Nishida - 2009 - books.google.com
Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals
and applications of strain in semiconductors and semiconductor devices that is relevant for …

Nanoscale strained-Si MOSFET physics and modeling approaches: a review

A Chaudhry, JN Roy, G Joshi - Journal of Semiconductors, 2010 - iopscience.iop.org
An attempt has been made to give a detailed review of strained silicon technology. Various
device models have been studied that consider the effect of strain on the devices, and …

Nanoscale characterization of gate leakage in strained high-mobility devices

R Kapoor, E Escobedo-Cousin… - IEEE transactions on …, 2011 - ieeexplore.ieee.org
Epitaxial growth of strained layers used for highspeed electronic devices can induce surface
roughness, which impacts gate dielectric properties. To precisely understand the effect of …

Characterising gate dielectrics in high mobility devices using novel nanoscale techniques

R Kapoor, E Escobedo-Cousin, SH Olsen… - Microelectronics …, 2010 - Elsevier
Strained Si and strained SiGe layers can increase the speed of MOS devices through
enhanced electron and hole mobilities compared with bulk Si. However, epitaxial growth of …

Strain engineering of silicon–germanium (SiGe) virtual substrates

K Sawano - Silicon–Germanium (SiGe) Nanostructures, 2011 - Elsevier
Strained Si/Ge channel devices with highly enhanced mobilities are formed on SiGe strain-
relaxed buffer layers, called SiGe virtual substrates, hence crystal qualities of the virtual …

Nanoscale characterisation of dielectrics for advanced materials and electronic devices

R Kapoor - 2013 - theses.ncl.ac.uk
Strained silicon (Si) and silicon-germanium (SiGe) devices have long been recognised for
their enhanced mobility and higher on-state current compared with bulk-Si transistors …

[CITATION][C] Nanoscale strained-Si MOSFET physics and modeling approaches: a review

JN Roy - 半导体学报: 英文版, 2010