Molecular beam epitaxy and characterization of ferroelectric quaternary alloy Sc0. 2Al0. 45Ga0. 35N

S Yang, D Wang, MMH Tanim, D Wang, Z Mi - Applied Physics Letters, 2024 - pubs.aip.org
In this study, we demonstrate ferroelectricity in high-quality monocrystalline quaternary alloy
ScAlGaN. Sc 0.2 Al 0.45 Ga 0.35 N films are grown by plasma-assisted molecular beam …

Ferroelectric Al0.85Sc0.15N and Hf0.5Zr0.5O2 Domain Switching Dynamics

R Guido, X Wang, B Xu, R Alcala… - … Applied Materials & …, 2024 - ACS Publications
The capability to reliably program partial polarization states with nanosecond programming
speed and femtojoule energies per bit in ferroelectrics makes them an ideal candidate to …

Probing of Polarization Reversal in Ferroelectric (Al, Sc) N Films Using Single‐and Tri‐Layered Structures With Different Sc/(Al+ Sc) Ratio

S Yasuoka, T Shimizu, K Okamoto… - Advanced Materials …, 2024 - Wiley Online Library
Abstract Wurtzite‐(Al, Sc) N films are promising candidates for ferroelectric memory devices
owing to their outstanding properties. However, there are many challenges on the way to …

[HTML][HTML] Excellent piezoelectric and ferroelectric properties of ScxGa1− xN alloy with high Sc concentration

M Uehara, K Hirata, Y Nakamura, SA Anggraini… - APL Materials, 2024 - pubs.aip.org
Alloying wurtzite aluminum nitride and gallium nitride (GaN) with scandium (Sc) enhances
the piezoelectric and ferroelectric properties, but increasing the Sc concentration while …

Effect of abnormally oriented grains on the ferroelectric properties of Al0. 65Sc0. 35N thin films

J **, D Zhou, Y Tong, Y Zhao, T Lv - Materials Today Communications, 2024 - Elsevier
The wide bandgap wurtzite Al 1-x Sc x N ferroelectric material is compatible with
semiconductor processes and offers advantages such as high remanent polarization (P r) …

[BOG][B] Growth and Ferroelectric Properties of Sputtered Aluminum Nitride-Based Thin Films

J Hayden - 2024 - search.proquest.com
Ferroelectrics are materials with crystallographically defined spontaneous polarizations that
can be reoriented by application of an electric field. The polarization remains after removal …

Identification of compressive strain in thin ferroelectric Al1–x Sc x N films by Raman spectroscopy

Y Tokita, T Hoshii, H Wakabayashi… - Japanese Journal of …, 2024 - iopscience.iop.org
Compressive strain in thin ferroelectric Al 1–x Sc x N films with different Sc atom
concentrations (x) on sapphire substrates was identified by Raman spectroscopy …