Characterizing electron beam induced damage in metrology and inspection of advance devices

Turnitin 降AI改写 早检测系统 早降重系统 Turnitin-UK版 万方检测-期刊版 维普编辑部版 Grammarly检测 Paperpass检测 checkpass检测 PaperYY检测

Sounding out buried nanostructures using subsurface ultrasonic resonance force microscopy

MH van Es, A Mohtashami, PLMJ van Neer… - MRS …, 2018 - cambridge.org
Imaging of nanoscale structures buried in a covering material is an extremely challenging
task, but is also considered extremely important in a wide variety of fields. From fundamental …
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