Fluorite-structured antiferroelectric hafnium-zirconium oxide for emerging nonvolatile memory and neuromorphic-computing applications

K Xu, T Wang, J Yu, Y Liu, Z Li, C Lu, J Song… - Applied Physics …, 2024 - pubs.aip.org
The rapid progress of the internet of things, cloud computing, and artificial intelligence has
increased demand for high-performance computing. This demand has led to a focused …

Exploring tungsten-oxygen vacancy synergy: Impact on leakage characteristics in Hf0. 5Zr0. 5O2 ferroelectric thin films

X Wang, M Wu, T Zhang, B Cui, YC Li, J Liu… - Applied Physics …, 2024 - pubs.aip.org
The recent discovery of ferroelectric properties in HfO 2 has sparked significant interest in
the fields of nonvolatile memory and neuromorphic computing. Yet, as device scaling …

Back-End of Line Compatible Hf0.5Zr0.5O2/ZrO2/Hf0.5Zr0.5O2 Stack Achieving 2Pr of 39.6 μC/cm2 and Endurance Exceeding 1010 Cycles Under Low …

YC Liu, JN Yang, YC Li, XL Zhou, KL Xu… - IEEE Electron …, 2023 - ieeexplore.ieee.org
In this letter, the back-end of line (BEOL) compatible H0. 5Z0. 5O2/ZrO2/H0. 5Z0. 5O2 stack
was designed for enhancing both the ferroelectricity and reliability under low-voltage …

Structural characteristics and polarization switching behaviors in HfO2-ZrO2 ferroelectric nanolaminates

Z Yang, B Zeng, C Ju, J Liao, S Zheng, M Liao… - Journal of Alloys and …, 2024 - Elsevier
Abstract Hf 0.5 Zr 0.5 O 2 solid solution ferroelectric thin film is an extremely promising
candidate for ferroelectric memories due to the high compatibility with silicon-based …

Improvement of the Ferroelectric Response of La-Doped Hafnium Zirconium Oxide Employing Tungsten Oxide Interfacial Layer with Back-End-of-Line Compatibility

DS Kwon, J Bizindavyi, G De, A Belmonte… - … Applied Materials & …, 2024 - ACS Publications
In this work, the impact of a tungsten oxide (WO3) seed and cap** layer for ferroelectric La-
doped (Hf, Zr) O2 (La: HZO) based capacitors, designed with back-end-of-line (BEOL) …

[HTML][HTML] Improvement of memory storage capacity and prolongation of endurance/retention through H2 plasma treatment of IGZO/HZO structure

CR Liu, YT Tsai, YT Chen, ZK Chen… - Journal of Applied …, 2024 - pubs.aip.org
In this study, we integrated an Indium Gallium Zinc Oxide (IGZO) channel with a superlattice
of HfO 2/ZrO 2 (HZO) under low-thermal-budget microwave annealing to produce nearly …

HfO2–ZrO2 Superlattice Ferroelectric Films as Gates for 2D MoS2-Based Negative-Capacitance Transistors with Enhanced Subthreshold and Endurance …

J Zou, X Zou, J Xu, H Wang, L Liu - ACS Applied Nano Materials, 2024 - ACS Publications
A nanoscale ferroelectric film with a periodic 4×[HfO2 (10 Å)-ZrO2 (5 Å)] superlattice (HZSL)
structure was prepared with an optimal annealing temperature identified as 500° C to …

Demonstration of Wake-up Free 6 nm Ultrathin ZrO2-HfO2 Superlattice Ferroelectric Capacitors with High Endurance against Fatigue

YK Liang, Z Liu, Z Cai, X Han, HY Huang… - IEEE Electron …, 2024 - ieeexplore.ieee.org
This study presents the ferroelectric polarization stability characteristics of ultrathin (6 nm)
superlattice (SL) ferroelectric layer metal-ferroelectric-metal (MFM) capacitors fabricated with …

[HTML][HTML] Insights into the ferroelectric orthorhombic phase formation in doped HfO2 thin films

Y Wen, M Wu, B Cui, X Wang, Y Wu, YC Li… - Journal of Applied …, 2024 - pubs.aip.org
Despite the extensive research on HfO 2-based thin films, the ferroelectric orthorhombic
phase formation remains unclear. This work proposes a physical picture throughout the …

Phase transition kinetics and sublayer optimization of HfO2/ZrO2 superlattice ferroelectric thin films

Y Wang, C Zhu, H Sun, W Wang, L Zou, Y Yi… - Applied Physics …, 2024 - pubs.aip.org
The sublayer thickness of superlattices, as a key factor affecting lattice integrity, interface
defects, and strain, deserves in-depth studies about its impact on improving ferroelectric …