To facilitate the rapid development of van der Waals materials and heterostructures,
scanning probe methods capable of nondestructively visualizing atomic lattices and moiré …

The initial development and preliminary validation of improvements to an existing approach-
to-contact atomic force microscopy (AFM) method for determining the Hamaker constant, A …

Atomic force microscopy (AFM) images normally exhibit various artifacts. As a result, image
flattening is required prior to image analysis. To obtain optimized flattening results …

Interfacial nanobubbles (NBs) and nanodroplets (NDs) have been attracting increasing
attention due to their potential for numerous applications. As a result, the automated …

The atomic force microscope (AFM) is one of the most powerful tools for high-resolution
imaging and high-precision positioning for nanomanipulation. The selection of the scanning …

This study concerns imaging of the structure of materials using AFM tap** (TM) and phase
imaging (PI) mode, using probes modified with focused ion beam (FIB). Three kinds of …

High-resolution nanometrology is a critical area of development for nanoscale
manufacturing, especially as it affects production throughput and fabrication quality …

Particle adhesion plays a significant role in a wide range of industries and applications
including pharmaceuticals, semiconductors, explosive detection systems, and the …

Background. An important problem in molecular biology is to determine the complete
transcription profile of a single cell, a snapshot that shows which genes are being expressed …

To facilitate the rapid development of van der Waals materials and heterostructures,
scanning probe methods capable of nondestructively visualizing atomic lattices and moiré …