Artificial intelligence applications for MEMS-based sensors and manufacturing process optimization

I Podder, T Fischl, U Bub - Telecom, 2023 - mdpi.com
Micro-electromechanical systems (MEMS) technology-based sensors have found diverse
fields of application due to the advancement in semiconductor manufacturing technology …

Smart calibration and monitoring: leveraging artificial intelligence to improve MEMS-based inertial sensor calibration

I Podder, T Fischl, U Bub - Complex & Intelligent Systems, 2024 - Springer
Micro-electro-mechanical systems (MEMS)-based sensors endure complex production
processes that inherently include high variance. To meet rigorous client demands (such as …

An Explainable Artificial Intelligence Framework for Improving Semiconductor Manufacturing: A Design Science Research Approach

I Podder, U Bub - 2024 - aisel.aisnet.org
The semiconductor manufacturing industry is undergoing a data-driven revolution, driven by
advancements in electronic devices and smart technologies. This shift has significantly …

A Design Science Research Approach Towards Knowledge Discovery and Predictive Maintenance of MEMS Inertial Sensors Using Machine Learning

I Podder, U Bub - International Conference on Computational Collective …, 2023 - Springer
Abstract Knowledge discovery is the process of extracting relevant and practical information
from a collection of structured or unstructured data. In numerous applications, such as …

[PDF][PDF] Artificial Intelligence Applications for MEMS-Based Sensors and Manufacturing Process Optimization. Telecom 2023, 4, 165–197

I Podder, T Fischl, U Bub - 2023 - academia.edu
Micro-electromechanical systems (MEMS) technology-based sensors have found diverse
fields of application due to the advancement in semiconductor manufacturing technology …

АЛГОРИТМЫ ОБРАБОТКИ ДАННЫХ ДЛЯ ДИАГНОСТИКИ ЭЛЕКТРОМЕХАНИЧЕСКИХ СИСТЕМ С ИСПОЛЬЗОВАНИЕМ МАШИННОГО ОБУЧЕНИЯ

ГС ВЕРЕСНИКОВ, АВ СКРЯБИН, АВ ГОЛЕВ - ПРИБОРЫ И СИСТЕМЫ … - elibrary.ru
В статье рассматривается проблема создания алгоритмов для идентификации
технического состояния электромеханических систем (ЭС) с использованием методов …