Germanium based field-effect transistors: Challenges and opportunities

PS Goley, MK Hudait - Materials, 2014‏ - mdpi.com
The performance of strained silicon (Si) as the channel material for today's metal-oxide-
semiconductor field-effect transistors may be reaching a plateau. New channel materials …

Germanium surface passivation and atomic layer deposition of high-k dielectrics—a tutorial review on Ge-based MOS capacitors

Q **e, S Deng, M Schaekers, D Lin… - Semiconductor …, 2012‏ - iopscience.iop.org
Due to its high intrinsic mobility, germanium (Ge) is a promising candidate as a channel
material (offering a mobility gain of approximately× 2 for electrons and× 4 for holes when …

N-Channel Germanium MOSFET Fabricated Below 360 by Cobalt-Induced Dopant Activation for Monolithic Three-Dimensional-ICs

JH Park, D Kuzum, WS Jung… - IEEE Electron Device …, 2011‏ - ieeexplore.ieee.org
Below 360° C, we demonstrate germanium (Ge) n+/p junction diode and n-channel Ge
metal-oxide-semiconductor field-effect transistor (MOSFET) with a low temperature Al/Al 2 O …

Enabling energy efficiency and polarity control in germanium nanowire transistors by individually gated nanojunctions

J Trommer, A Heinzig, U Muhle, M Loffler, A Winzer… - ACS …, 2017‏ - ACS Publications
Germanium is a promising material for future very large scale integration transistors, due to
its superior hole mobility. However, germanium-based devices typically suffer from high …

III–V/Ge channel MOS device technologies in nano CMOS era

S Takagi, R Zhang, J Suh, SH Kim… - Japanese Journal of …, 2015‏ - iopscience.iop.org
CMOS utilizing high-mobility III–V/Ge channels on Si substrates is expected to be one of the
promising devices for high-performance and low power advanced LSIs in the future …

Hysteresis in carbon nanotube transistors: measurement and analysis of trap density, energy level, and spatial distribution

RS Park, MM Shulaker, G Hills… - ACS …, 2016‏ - ACS Publications
We present a measurement technique, which we call the Pulsed Time-Domain
Measurement, for characterizing hysteresis in carbon nanotube field-effect transistors, and …

High speed and ultra-low dark current Ge vertical pin photodetectors on an oxygen-annealed Ge-on-insulator platform with GeOx surface passivation

B Son, Y Lin, KH Lee, Y Wang, S Wu, CS Tan - Optics Express, 2020‏ - opg.optica.org
Germanium (Ge) vertical pin photodetectors were demonstrated with an ultra-low dark
current of 0.57 mA/cm^ 2 at− 1 V. A germanium-on-insulator (GOI) platform with a 200-mm …

Surface passivation of germanium by atomic layer deposited Al2O3 nanolayers

WJH Berghuis, J Melskens, B Macco… - Journal of Materials …, 2021‏ - Springer
Surfaces of semiconductors are notorious for the presence of electronic defects such that
passivation approaches are required for optimal performance of (opto) electronic devices …

Atomic layer deposition of dielectrics on Ge and III–V materials for ultrahigh performance transistors

RM Wallace, PC McIntyre, J Kim, Y Nishi - MRS bulletin, 2009‏ - cambridge.org
The prospect of utilizing alternative transistor channel materials for ultrahigh performance
transistors will require suitable gate dielectrics for surface-channel field-effect devices. With …

Ge (100) and (111) N- and P-FETs With High Mobility and Low- Mobility Characterization

D Kuzum, AJ Pethe, T Krishnamohan… - IEEE transactions on …, 2009‏ - ieeexplore.ieee.org
In this paper, we demonstrate high-mobility bulk Ge N-and P-FETs with GeON gate
dielectric. The highest electron mobility to date in Ge is reported, and two times improvement …