High-performance ferroelectric field-effect transistors with ultra-thin indium tin oxide channels for flexible and transparent electronics

Q Li, S Wang, Z Li, X Hu, Y Liu, J Yu, Y Yang… - Nature …, 2024 - nature.com
With the development of wearable devices and hafnium-based ferroelectrics (FE), there is
an increasing demand for high-performance flexible ferroelectric memories. However …

Recent research for HZO-based ferroelectric memory towards in-memory computing applications

J Yoo, H Song, H Lee, S Lim, S Kim, K Heo, H Bae - Electronics, 2023 - mdpi.com
The AI and IoT era requires software and hardware capable of efficiently processing
massive amounts data quickly and at a low cost. However, there are bottlenecks in existing …

Monolithic 3D integration as a pathway to energy-efficient computing and beyond: From materials and devices to architectures and chips

Y Fan, R An, J Tang, Y Li, T Liu, B Gao, H Qian… - Current Opinion in Solid …, 2024 - Elsevier
As emerging technologies like artificial intelligence (AI) and big data continue to evolve, the
demand for high-performance computing (HPC) has been increasing, driving the …

Can Interface Layer be Really Free for HfxZr1-xO2 Based Ferroelectric Field-Effect Transistors With Oxide Semiconductor Channel?

T Cui, D Chen, Y Dong, Y Fan, Z Yao… - IEEE Electron …, 2024 - ieeexplore.ieee.org
The HfxZr1− xO2 (HZO) based ferroelectric field-effect transistors (FeFETs) with oxide
semiconductor channel have been proposed to have the potential of interface layer (IL) free …

HfO2–ZrO2 Superlattice Ferroelectric Field-Effect Transistor With Improved Endurance and Fatigue Recovery Performance

Y Peng, W **ao, F Liu, C **, Y Cheng… - … on Electron Devices, 2023 - ieeexplore.ieee.org
In this brief, we report that HfO 2–ZrO 2 superlattice (SL) ferroelectric field-effect transistors
(FeFETs) demonstrate improved endurance, fatigue recovery, and retention performance …

Role of nitrogen in suppressing interfacial states generation and improving endurance in ferroelectric field-effect transistors

S Dai, S Li, S Xu, F Tian, J Chai, J Duan… - … on Electron Devices, 2024 - ieeexplore.ieee.org
In this study, we investigate the impact of nitridation in Hf Zr O2-based ferroelectric field-
effect transistors (FeFETs) with a SiON interfacial layer (IL). We fabricated the SiON IL using …

High-performance top-gated and double-gated oxide–semiconductor ferroelectric field-effect transistor enabled by channel defect self-compensation effect

CK Chen, S Hooda, Z Fang, M Lal, Z Xu… - … on Electron Devices, 2023 - ieeexplore.ieee.org
In this article, we demonstrate a low-thermal budget defect-engineered process to achieve
top-gated (TG) oxide–semiconductor ferroelectric field-effect transistors (FeFETs). The …

A Physics-Based Model for Oxide–Semiconductor-Based Ferroelectric Field-Effect Transistors

FX Liang, S Kumar, K Ni, W Chakraborty… - … on Electron Devices, 2024 - ieeexplore.ieee.org
This article presents a comprehensive physics-based model for back-end-of-line (BEOL)-
compatible oxide-semiconductor-based ferroelectric field-effect transistors (FeFETs). The …

Impact of random interface traps fluctuation on device variation of oxide-semiconductor ferroelectric field-effect transistor memories

Q Li, YX Yang, TT Cheng, LY Ying… - IEEE Electron …, 2023 - ieeexplore.ieee.org
In this letter, we systematically investigate the impact of randomly distributed
ferroelectric/interlayer (FE/IL) and interlayer/oxide-semiconductor (IL/OS) interface traps …

First Demonstration of High-Performance and Extremely Stable W-Doped In2O3 Gate-All-Around (GAA) Nanosheet FET

E Sarkar, C Zhang, D Chakraborty… - … on Electron Devices, 2025 - ieeexplore.ieee.org
We demonstrate a gate-all-around (GAA) nanosheet FET featuring an atomic layer-
deposited (ALD) tungsten (W)-doped indium oxide (In 2 O 3), or indium tungsten oxide …