Design and Control of Versatile High-speed and Large-range Atomic Force Microscopes

F **a - 2020 - dspace.mit.edu
Microscopy instruments are important in nano-technology research for imaging of nanoscale
phenomena. Among such tools is the atomic force microscope (AFM) for nanoscale imaging …

Multifunctional cantilevers for simultaneous enhancement of contact resonance and harmonic atomic force microscopy

W Wang, K Zhang, W Zhang, Y Hou, Y Chen - Nanotechnology, 2021 - iopscience.iop.org
To enhance contact resonance atomic force microscopy (CR-AFM) and harmonic AFM
imaging simultaneously, we design a multifunctional cantilever. Precise tailoring of the …