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Static and dynamic obfuscations of scan data against scan-based side-channel attacks
Due to the fallibility of advanced integrated circuit (IC) fabrication processes, scan test has
been widely used by cryptographic ICs to provide high fault coverage. Full controllability and …
been widely used by cryptographic ICs to provide high fault coverage. Full controllability and …
Reverse engineering IoT devices: Effective techniques and methods
Recent Internet of Things (IoT) botnet attacks have called the attention to the fact that there
are many vulnerable IoT devices connected to the Internet today. Some of these Web …
are many vulnerable IoT devices connected to the Internet today. Some of these Web …
Fine-grained access management in reconfigurable scan networks
Modern very large scale integration designs incorporate a high amount of instrumentation
that supports post-silicon validation and debug, volume test and diagnosis, as well as in …
that supports post-silicon validation and debug, volume test and diagnosis, as well as in …
Security vulnerability analysis of design-for-test exploits for asset protection in SoCs
SoCs implementing security modules should be both testable and secure. Oversights in a
design's test structure could expose internal modules creating security vulnerabilities during …
design's test structure could expose internal modules creating security vulnerabilities during …
Defining the decision factors for managing defects: A technical debt perspective
W Snipes, B Robinson, Y Guo… - 2012 Third International …, 2012 - ieeexplore.ieee.org
Making a decision about whether to fix or defer fixing a defect is important to software
projects. Deferring defects accumulates a technical debt that burdens the software team and …
projects. Deferring defects accumulates a technical debt that burdens the software team and …
Scaling the effective area of higher-order-mode erbium-doped fiber amplifiers
We demonstrate scaling of the effective area of higher-order mode, Er-doped fiber
amplifiers. Two Er-doped higher-order mode fibers, one with 3800 μm^ 2 A_eff in the LP_0 …
amplifiers. Two Er-doped higher-order mode fibers, one with 3800 μm^ 2 A_eff in the LP_0 …
Security analysis of scan obfuscation techniques
Scan is the de-facto standard for testing, which provides high observability and test
coverage by enabling direct access to chip memory elements. The scan-based Design-for …
coverage by enabling direct access to chip memory elements. The scan-based Design-for …
Opening Pandora's box: effective techniques for reverse engineering IoT devices
With the growth of the Internet of Things, many insecure embedded devices are entering into
our homes and businesses. Some of these web-connected devices lack even basic security …
our homes and businesses. Some of these web-connected devices lack even basic security …
Testing the trustworthiness of IC testing: An oracle-less attack on IC camouflaging
Test of integrated circuits (ICs) is essential to ensure their quality; the test is meant to prevent
defective and out-of-spec ICs from entering into the supply chain. The test is conducted by …
defective and out-of-spec ICs from entering into the supply chain. The test is conducted by …
Ensuring cryptography chips security by preventing scan-based side-channel attacks with improved DFT architecture
W Wang, X Wang, J Wang, NN **ong… - IEEE Transactions on …, 2020 - ieeexplore.ieee.org
Cryptography chips are often used in some applications, such as smart grids and Internet of
Things (IoT) to ensure their security. Cryptographic chips must be strictly tested to guarantee …
Things (IoT) to ensure their security. Cryptographic chips must be strictly tested to guarantee …