In this overview, the applicability of X-ray diffraction line profile analysis (XLPA) for the
characterization of the microstructure in nanostructured materials is overviewed. The …

Abstract The Co–Cr–Cu–Fe–Ni–Zn compositional library was studied on a combinatorial
high-entropy alloy thin film processed on a silicon substrate by magnetron sputtering …

Abstract CoCrMoWSi, CoCrMoWTi, and CoCrMoWNb medium entropy alloys (MEAs) were
manufactured by powder metallurgy technique. The MEAs were sintered in a vacuum …

Multi-principal element alloys (MPEAs) are in the forefront of materials science since their
compositions can be found in the undiscovered central parts of phase diagrams. These …

At the interface of thin film development and powder metallurgy technologies, this study aims
to characterise the mechanical properties, lattice constants and phase formation of Ti-Nb …

A novel artificial intelligence-assisted evaluation of the X-ray diffraction (XRD) peak profiles
was elaborated for the characterization of the nanocrystallite microstructure in a …

Abstract A Cosingle bondFesingle bondNisingle bondZn multi-principal element alloy
(MPEA) film with the thickness of about 2.5 μm is processed by electrodeposition. The layer …

Multiprincipal element alloys (MPEAs) including high‐entropy alloys are in the focus of
materials science since many MPEA compositions exhibit outstanding mechanical and …

The study of the transition from high-entropy alloys (HEAs) to conventional alloys (CAs)
composed of the same alloying components is apparently important, both for understanding …

Multi-principal element alloys (MPEAs) are at the forefront of materials science due to their
large variety of compositions, which can yield unexplored properties. Map** the structure …