Challenges and trends in modern SoC design verification

W Chen, S Ray, J Bhadra, M Abadir… - IEEE Design & …, 2017 - ieeexplore.ieee.org
Challenges and Trends in Modern SoC Design Verification Page 1 7 2168-2356/17 © 2017
IEEE Copublished by the IEEE CEDA, IEEE CASS, IEEE SSCS, and TTTC September/October …

Data Analytics and Machine Learning for Coverage Closure

R Gal, W Ibraheem, Z Nevo, B Saleh, A Ziv - Frontiers of Quality Electronic …, 2022 - Springer
Functional coverage is a de facto standard for monitoring the state of the verification process
and its progress. Therefore, coverage closure, which is the process of advancing coverage …

Machine Learning in the Service of Hardware Functional Verification

R Gal, A Ziv - Machine Learning Applications in Electronic Design …, 2022 - Springer
Modern hardware functional verification employs many different tools alongside large
compute farms to ensure that the hardware's implementation matches its specification. This …

Using machine learning clustering to find large coverage holes

R Gal, G Simchoni, A Ziv - Proceedings of the 2020 ACM/IEEE …, 2020 - dl.acm.org
Identifying large and important coverage holes is a time-consuming process that requires
expertise in the design and its verification environment. This paper describes a novel …

Template aware coverage: Taking coverage analysis to the next level

R Gal, E Kermany, B Saleh, A Ziv, M Behm… - Proceedings of the 54th …, 2017 - dl.acm.org
Understanding the relationship between coverage and test-templates (a generic term we
use to describe the inputs for the random stimuli generator) is an important layer in …

Diminution of test templates in test suites

SS Ackerman, R Gal, A Koyfman, A Ziv - US Patent 11,023,366, 2021 - Google Patents
A method, apparatus and product for reducing a number of test templates in a test suite. The
method comprises determining, for a first test template of the test suite, a first probabilities …

Data Analytics and Machine Learning for Coverage Closure

WI Raviv Gal, Z Nevo, B Saleh… - Frontiers of Quality …, 2023 - books.google.com
Verification in general and specifically functional verification are, without a doubt, some of
the most important and labor-intensive parts of a hardware design cycle. Some market …

Risk analysis based on design version control data

R Gal, G Shurek, G Simchoni… - 2019 ACM/IEEE 1st …, 2019 - ieeexplore.ieee.org
Early identification of areas that are at-risk in a design under development can help design
and verification teams take early preventive and corrective measures. We propose a novel …

Post-silicon validation of the ibm power9 processor

T Kolan, H Mendelson, V Sokhin… - … , Automation & Test …, 2020 - ieeexplore.ieee.org
Due to the complexity of designs, post-silicon validation remains a major challenge with few
systematic solutions. We provide an overview of the state-of-the-art post silicon validation …