Advances of RRAM devices: Resistive switching mechanisms, materials and bionic synaptic application

Z Shen, C Zhao, Y Qi, W Xu, Y Liu, IZ Mitrovic, L Yang… - Nanomaterials, 2020 - mdpi.com
Resistive random access memory (RRAM) devices are receiving increasing extensive
attention due to their enhanced properties such as fast operation speed, simple device …

Metal–oxide RRAM

HSP Wong, HY Lee, S Yu, YS Chen, Y Wu… - Proceedings of the …, 2012 - ieeexplore.ieee.org
In this paper, recent progress of binary metal–oxide resistive switching random access
memory (RRAM) is reviewed. The physical mechanism, material properties, and electrical …

Resistive random access memory (ReRAM) based on metal oxides

H Akinaga, H Shima - Proceedings of the IEEE, 2010 - ieeexplore.ieee.org
In this paper, we review the recent progress in the resistive random access memory
(ReRAM) technology, one of the most promising emerging nonvolatile memories, in which …

The effect of tunnel barrier at resistive switching device for low power memory applications

H Choi, J Yi, S Hwang, S Lee, S Song… - 2011 3rd IEEE …, 2011 - khu.elsevierpure.com
In order to realize the high density array device and suppress the disturbance between the
cells, ReRAM also seem to need a selective device same as a diode in PCRAM. Still, while …

Future materials for beyond Si integrated circuits: a Perspective

L Colombo, S El Kazzi, M Popovici… - … on Materials for …, 2024 - ieeexplore.ieee.org
The integration of novel materials has been pivotal in advancing Si-based devices ever
since Si became the preferred material for transistors, and later, integrated circuits. New …

[PDF][PDF] Electrothermal Analysis of Memristors and Thermistors

K Lahbacha - 2022 - tesidottorato.depositolegale.it
The high demands of reducing power consumption for electronic applications and
decreasing the current and voltage range have increased the technological development of …

Study of one dimension thickness scaling on Cu/HfOx/Pt based RRAM device performance

M Wang, HB Lv, Q Liu, YT Li, HW **e… - 2012 4th IEEE …, 2012 - ieeexplore.ieee.org
Scaling is a key issue for resistive switching (RS) memory before commercialization. In this
paper, for the first time, we reveal the impact of electrode diffusion on the device …

First-principles simulation of oxygen vacancy migration in , , and at their interfaces for applications in resistive random-access memories

AA Bhatti, CC Hsieh, A Roy, LF Register… - Journal of …, 2016 - Springer
Transition metal-oxide resistive random-access memories seem to be a viable candidate as
the next-generation storage technology because transition metals have multiple oxidation …

[BOOK][B] Resistive switching and memory effects in silicon oxide based nanostructures

J Yao - 2011 - search.proquest.com
Silicon oxide (SiO x 1< x≦ 2) has long been used and considered as a passive and
insulating component in the construction of electronic devices. In contrast, here the active …

Analysis on data storage area of NiO-ReRAM with secondary electron image

K Kinoshita, T Makino, T Yoda, K Dobashi… - Journal of Materials …, 2011 - cambridge.org
Both low and high resistance states (which were written by voltage application in a local
region of NiO/Pt films using conducting atomic force microscopy [C-AFM]) were observed …